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Proceedings of the IEEE 2002 Custom Integrated Circuits Conference (Cat. No.02CH37285), 2003
Although the industry has long known about soft errors, customer awareness and concern about soft errors has recently increased. Advances in customer education, estimation techniques, and materials quality assist an ASIC designer in reducing soft-error system fails.
Larry Wissel +4 more
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Although the industry has long known about soft errors, customer awareness and concern about soft errors has recently increased. Advances in customer education, estimation techniques, and materials quality assist an ASIC designer in reducing soft-error system fails.
Larry Wissel +4 more
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2021
Soft errors are transient events with a short time interval induced by energetic particles coming from terrestrial and space radiations. Radiation-induced soft errors may cause critical failures in system behavior, leading to financial or human life losses.
Alexandra Zimpeck +3 more
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Soft errors are transient events with a short time interval induced by energetic particles coming from terrestrial and space radiations. Radiation-induced soft errors may cause critical failures in system behavior, leading to financial or human life losses.
Alexandra Zimpeck +3 more
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Soft errors: is the concern for soft-errors overblown?
IEEE International Conference on Test, 2005., 2005Cosmic ray particles have the ability to either toggle the state of memory elements or create unwanted glitches in combinational logic that may be latched by memory elements. As supply voltages reduce and feature sizes become smaller in future technologies, soft error tolerance is considered a significant challenge for designing future electronic ...
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CEP: Correlated Error Propagation for Hierarchical Soft Error Analysis
Journal of Electronic Testing, 2013Due to the continuous technology scaling, soft error becomes a major reliability issue at nanoscale technologies. Single or multiple event transients at low levels can result in multiple correlated bit flips at logic or higher abstraction levels. Addressing this correlation is essential for accurate low-level soft error rate estimation, and more ...
Chen, L., Ebrahimi, M., Tahoori, M. B.
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2020
Embedded systems reliability is a wide subject and complex subject. For this reason, chapter two explores the main reliability challenges in electronic-based systems: Process Variability, Permanent faults, and Transient faults. Moreover, this chapter provides a brief introduction to Radiation-Induced Soft Errors.
Felipe Rocha da Rosa +2 more
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Embedded systems reliability is a wide subject and complex subject. For this reason, chapter two explores the main reliability challenges in electronic-based systems: Process Variability, Permanent faults, and Transient faults. Moreover, this chapter provides a brief introduction to Radiation-Induced Soft Errors.
Felipe Rocha da Rosa +2 more
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12th IEEE International On-Line Testing Symposium (IOLTS'06), 2006
Summary form only given. The quality of electrical tests during irradiation of components has also improved a lot. Test patterns have been modified and characteristics of recent DRAMs have had to be taken into account. We can also observe a trend in the results of soft error tests.
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Summary form only given. The quality of electrical tests during irradiation of components has also improved a lot. Test patterns have been modified and characteristics of recent DRAMs have had to be taken into account. We can also observe a trend in the results of soft error tests.
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A dynamic approach to tolerate soft errors
Cluster Computing, 2012Dynamic implementation for software-based soft error tolerance method which can protect more types of codes can cover more soft errors. This paper explores soft error tolerance with dynamic software-based method. We propose a new dynamic software-based approach to tolerate soft errors.
Lei Xiong, Qingping Tan
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Modeling the Propagation of Soft Errors in Programs
Proceedings of the 2nd International Conference on Computer Science and Software Engineering, 2019Due to the continuous growth of transistors in processors, the cloud computing paradigm and increasingly complex environment, soft errors, which are a category of typical transient errors, have become an urgent challenge in ground-level systems. To handle these errors, making clear the error propagation is the key step.
Lixing Xue, Zhan Zhang, Decheng Zou
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Enhancing I2C robustness to soft errors
2017 IEEE 8th Latin American Symposium on Circuits & Systems (LASCAS), 2017This paper proposes the use of a I2C Bus Monitor core able to perform data integrity verification activities, to signalize metrics about the quality of communications, to detect transient faults and permanent errors on the bus and to act on the devices connected to the bus for the recovery of such errors avoiding failures.
Vicente Carvalho +1 more
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On Soft Error Immunity of Sequential Circuits
2010 19th IEEE Asian Test Symposium, 2010With technology scaling, radiation-induced soft error has been a major concern even for mainstream enterprise applications. Since various hardening solutions impose significant costs in performance, area and power consumption, full soft error protection can hardly satisfy the multiple design goals simultaneously.
Dan Zhu, Tun Li, Sikun Li
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