Results 241 to 250 of about 139,876 (307)

Robust Shape-from-Focus via Physics-Inspired Distortion-Aware Focal Depth Regression. [PDF]

Sensors (Basel)
Li X, Shen W, Li J, Zhai Z, Guan X, Lei Z.   +5 more
europepmc   +1 more source

Performance of virtual unenhanced images on a prototype silicon photon counting detector CT: preliminary clinical results. [PDF]

BMC Biomed Eng
Salyapongse AM, Szczykutowicz TP, Lubner MG, Yin Z, Yan M, Yue M, McClure K, Toia GV.   +7 more
europepmc   +1 more source

A novel, tissue-selective burr for temporal bone drilling. [PDF]

Eur Arch Otorhinolaryngol
Ihalainen L, Iso-Mustajärvi M, Linder P, Dietz A.   +3 more
europepmc   +1 more source

Volume and surface methods for microparticle traction force microscopy: a computational and experimental comparison.

Soft Matter
Brauburger S, Kraus BK, Walther T, Mense C, Abele T, Göpfrich K, Schwarz US.   +6 more
europepmc   +1 more source

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An Experimental Study of Soft Errors in Microprocessors

IEEE Micro, 2005
The issue of soft errors is an important emerging concern in the design and implementation of future microprocessors. The authors examine the impact of soft errors on two different microarchitectures: a DLX processor for embedded applications and a high-performance alpha processor.
R K Iyer
exaly   +2 more sources

Soft errors

Proceedings of the eighth IEEE/ACM/IFIP international conference on Hardware/software codesign and system synthesis, 2012
A recent report from the ITRS identifies soft errors, as one of the most important reliability challenges for the coming decades. Soft errors are transient errors caused by several effects e.g., voltage fluctuations, wire-cross talks, and cosmic particle strikes; and manifest as a temporary switch of the logic value of a transistor.
Kyoungwoo Lee, Aviral Shrivastava, Reiley Jeyapaul   +2 more
openaire   +1 more source

Reducing Soft Errors through Operand Width Aware Policies [PDF]

IEEE Transactions on Dependable and Secure Computing, 2009
Soft errors are an important challenge in contemporary microprocessors. Particle hits on the components of a processor are expected to create an increasing number of transient errors with each new microprocessor generation.
Oguz Ergin, Osman Unsal, Xavier Vera
exaly   +4 more sources