Results 91 to 100 of about 37,708 (227)
, 2010 ISBN 978-1-4244-5833-2International audienceProgrammable devices like SRAM-based FPGAs, thanks to their low cost and high flexibility, are increasingly used for security applications; the mam drawback is their configuration memory, sensitive to ...
Leveugle, Régis +11 more
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Research on theTesting Technology for SRAM-Based FPGA
, 2009 半导体芯片的生产制造过程并不是完美无缺的，所有的芯片需要进行针对制造缺陷的测试。随着FPGA芯片规模越来越大，结构越来越复杂，产品测试也越来越困难。在FPGA测试所面临的主要问题是：对CLB、互连资源、IO资源等结构进行数学建模、测试配置算法和测试向量的开发、测试结构的选择、测试平台的搭建等。本文主要工作及创新点如下：根据FPGA的可配置逻辑单元的不同组成结构，给出了针对常规逻辑资源给出了8个测试配置达到100%覆盖率，，并提出了基于故障模型的可配置逻辑资源的测试方法，并在硬件测试平台中进行验证 ...
刘肄倬
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FPGA-based Architecture for Image Processing using Convolutional Neural Networks
, 2023 This article explores the architecture of FPGA-based Convolutional Neural Networks (CNN) for image processing. It examines the key characteristics of FPGA platforms and their impact on the performance and efficiency of CNN implementation.
Tsivinskyi, V., Чумак, В. С.
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The Journal of Engineering, 2019 With the shrinking feature sizes of static random access memory-based field programmable gate arrays (FPGAs), the occurrence probability of multiple-cell upsets (MCUs) in FPGAs continues to increase. This reduces the reliability of FPGAs.
Yue Li +3 more
doaj +1 more source
, 2013 This study investigates the total ionizing dose effect in static random access memory (SRAM)-based field programmable gate array (FPGA). In addition to γ ray whole-chip irradiation, focused synchrotron x-ray irradiation with beam size of 20 μm is also ...
Ding, Li Li +31 more
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Applied SciencesIn this paper, we propose Automatic Configuration Memory Fault Injection (ACMFI), a tool that calculates the architectural vulnerability factor (AVF) and soft error rate (SER) using the emulation fault injection technique. SER, which is essential for the
Dongmin Lee +4 more
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FPGA-based fault injection design for 16K-point FFT processor
The Journal of Engineering, 2019 There are a number of satellites working in the harsh space environment. The charged particles in space may strike the electron devices causing the undesired influences, such as soft errors in memory devices or permanent damage in hardware circuits ...
Chuang-An Mao +4 more
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ElectronicsWe are pleased to present this new issue of the journal featuring four compelling papers that highlight significant advancements across integrated circuit simulation, high-efficiency digital signal processing architectures, reliable memory design ...
Mladen Knezic
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Improve defect tolerance in a cluster of a SRAM-based Mesh of Cluster FPGA using hardware redundancy
, 2014 International audienceThe technological evolution involves a higher number of physical defects in circuits after manufacturing. One of the future challenge is to find a way to use a maximum of defected manufactured circuits.
Adrien Blanchardon +7 more
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Failure Probability and Fault Observability of SRAM-FPGA Systems
, 2011 We describe a simulation-based fault injection technique for failure probability and fault observability assessment of SRAM-FPGA systems. Our approach relies on a model of FPGA netlists realised with the Stochastic Activity Networks formalism. Faults can
Andrea Domenici +5 more
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