Results 21 to 30 of about 138 (136)

SRAM based FPGA system capable of runtime fault tolerance and recovery

open access: yesDianzi Jishu Yingyong, 2019
In order to enhance the reliability of electronic system working in radiation environment, a reliability enhanced SRAM based FPGA system with runtime fault recovery is presented in this work.
Xu Weijie   +3 more
doaj   +1 more source

An Energy-Efficient Convolutional Neural Network Processor Architecture Based on a Systolic Array

open access: yesApplied Sciences, 2022
Deep convolutional neural networks (CNNs) have shown strong abilities in the application of artificial intelligence. However, due to their extensive amount of computation, traditional processors have low energy efficiency when executing CNN algorithms ...
Chen Zhang   +5 more
doaj   +1 more source

Jitter-Quantizing-Based TRNG Robust Against PVT Variations

open access: yesIEEE Access, 2020
Security is critical to the growing popularity of the Internet of Things(IoT), and true random number generator (TRNG) plays an increasingly important role in information security systems.
Yingchun Lu   +7 more
doaj   +1 more source

Deep Q-Learning with Bit-Swapping-Based Linear Feedback Shift Register fostered Built-In Self-Test and Built-In Self-Repair for SRAM

open access: yesMicromachines, 2022
Including redundancy is popular and widely used in a fault-tolerant method for memories. Effective fault-tolerant methods are a demand of today’s large-size memories.
Mohammed Altaf Ahmed, Suleman Alnatheer
doaj   +1 more source

Fundamental Challenges, Physical Implementations, and Integration Strategies for Ising Machines in Large‐Scale Optimization Tasks

open access: yesAdvanced Electronic Materials, EarlyView.
Ising machines are emerging as specialized hardware solvers for computationally hard optimization problems. This review examines five major platforms—digital CMOS, analog CMOS, emerging devices, coherent optics, and quantum systems—highlighting physics‐rooted advantages and shared bottlenecks in scalability and connectivity.
Hyunjun Lee, Joon Pyo Kim, Sanghyeon Kim
wiley   +1 more source

Research on the Security of SRAM-Based FPGAs in the Era of Artificial Intelligence

open access: yesJournal of Low Power Electronics and Applications
SRAM-based FPGAs, with their flexible programmability and parallel execution features, have been widely used, and the security of such devices has drawn significant attention.
Jing Zhou   +5 more
doaj   +1 more source

A Scalable and Resource‐Efficient Pipelined p‐Computer for Probabilistic Ising Machines

open access: yesAdvanced Intelligent Systems, EarlyView.
(a) Block diagram of the portfolio optimization problem: given M assets, the goal is to determine the optimal weights w that maximize the expected return (based on the mean historical assets return u), while minimizing the risk, quantified by the assets covariance matrix S.
Deborah Volpe   +9 more
wiley   +1 more source

A Review on Soft Error Correcting Techniques of Aerospace-Grade Static RAM-Based Field-Programmable Gate Arrays

open access: yesSensors
Aerospace-grade SRAM-based field-programmable gate arrays (FPGAs) used in space applications are highly susceptible to single event effects, leading to soft errors in FPGAs.
Weihang Wang   +4 more
doaj   +1 more source

Neuromorphic Denoising with Fully Analog Memristive In‐Memory Computing

open access: yesAdvanced Intelligent Systems, Volume 8, Issue 8, August 2026.
This article borrows the concepts of episodic memory in human brains to experimentally implement a memristor‐based neuromorphic denoising process. A homogeneous memristor processing unit is experimentally demonstrated for both temporal storage and neural network computation, imitating the synapses in the human brain.
Daijing Shi   +5 more
wiley   +1 more source

On the Evaluation of the PIPB Effect within SRAM-based FPGAs

open access: yes2019 IEEE European Test Symposium (ETS), 2019
SRAM-based FPGAs are widely used in mission critical applications. Due to the increasing working frequency and technology scaling of ultra-nanometer technology, Single Event Transients (SETs) are becoming a major source of errors for these devices.
Corrado de sio   +2 more
openaire   +2 more sources

Home - About - Disclaimer - Privacy