Results 111 to 120 of about 10,751 (237)

A defect-oriented test approach using on-Chip current sensors for resistive defects in FinFET SRAMs

open access: green, 2018
Guilherme Cardoso Medeiros   +4 more
openalex   +2 more sources

A highly energy-efficient multi-core neuromorphic architecture for training deep spiking neural networks. [PDF]

open access: yesNat Commun
Li M   +18 more
europepmc   +1 more source

Ultrahigh-precision analog computing using memory-switching geometric ratio of transistors. [PDF]

open access: yesSci Adv
Yangdong XJ   +16 more
europepmc   +1 more source

Impact of Fabrication Defects on FPGA Logic Using Memristor-Based Memory Cells. [PDF]

open access: yesMicromachines (Basel)
Schoenen J   +10 more
europepmc   +1 more source

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