Results 31 to 40 of about 295,937 (324)
Active and Passive Electronic Components, 2023 Combining with a static random-access memory (SRAM) and resistive memory (RRAM), an improved 8T2R nonvolatile SRAM (nvSRAM) memory cell is proposed in this study. With differential mode, a pair of 1T1R RRAM is added to 6T SRAM storage node. By optimizing
Jiayu Yin, Wenli Liao, Chengying Chen
doaj +1 more source
Influence of parasitic capacitance variations on 65 nm and 32 nm predictive technology model SRAM core-cells [PDF]
, 2008 The continuous improving of CMOS technology allows the realization of digital circuits and in particular static random access memories that, compared with previous technologies, contain an impressive number of transistors.
Di Carlo, Stefano +3 more
core +1 more source
A Unique March Test Algorithm for the Wide Spread of Realistic Memory Faults in SRAMs [PDF]
, 2006 Among the different types of algorithms proposed to test static random access memories (SRAMs), march tests have proven to be faster, simpler and regularly structured.
Benso, Alfredo +4 more
core +1 more source
Sensors, 2023 This paper introduces an n-type pseudo-static gain cell (PS-nGC) embedded within dynamic random-access memory (eDRAM) for high-speed processing-in-memory (PIM) applications.
Subin Kim, Ingu Jeong, Jun-Eun Park
doaj +1 more source
March Test Generation Revealed [PDF]
, 2008 Memory testing commonly faces two issues: the characterization of detailed and realistic fault models and the definition of time-efficient test algorithms.
Benso, Alfredo +4 more
core +2 more sources
Effects of total ionizing dose on transient ionizing radiation upset sensitivity of 40–180 nm SRAMs
AIP Advances, 2022 Effects of total ionizing dose (TID) on the transient radiation upset sensitivity of commercial static random access memories (SRAMs) were investigated.
Junlin Li +8 more
doaj +1 more source
March AB, a State-of-the-Art March Test for Realistic Static Linked Faults and Dynamic Faults in SRAMs [PDF]
, 2007 Memory testing commonly faces two issues: the characterisation of detailed and realistic fault models, and the definition of time-efficient test algorithms able to detect them.
Bosio, Alberto +3 more
core +1 more source
Efficient Gauss Elimination for Near-Quadratic Matrices with One Short Random Block per Row, with Applications [PDF]
, 2019 In this paper we identify a new class of sparse near-quadratic random Boolean matrices that have full row rank over F_2 = {0,1} with high probability and can be transformed into echelon form in almost linear time by a simple version of Gauss elimination.
Dietzfelbinger, Martin, Walzer, Stefan
core +3 more sources
Combination-Encoding Content-Addressable Memory With High Content Density
IEEE Access, 2019 Recently, resistance switch-based content-addressable memory (RCAM) has been proposed as an alternative to the mainstream static random-access memory-based CAM because of its high integration potential and low static energy consumption. However, RCAM has
Guhyun Kim +5 more
doaj +1 more source
SU(2) Lattice Gauge Theory Simulations on Fermi GPUs [PDF]
, 2011 In this work we explore the performance of CUDA in quenched lattice SU(2) simulations. CUDA, NVIDIA Compute Unified Device Architecture, is a hardware and software architecture developed by NVIDIA for computing on the GPU.
Bhanot +14 more
core +1 more source