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An explainable AI framework for enhanced software defect prediction using transformer-assisted boosting. [PDF]
Kun Q +5 more
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Anatomy-guided visual prompt tuning for cross-modal breast cancer understanding. [PDF]
Zhao S +10 more
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A Review of Embedded Artificial Intelligence Research (2023-2026): Technological Advancements, Representative Advances, and Future Prospects. [PDF]
Zhang Z.
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An Intelligent Sensing Framework for Early Ransomware Detection Using MHSA-LSTM Machine Learning. [PDF]
Alqahtani A, Ohemeng MO, Sheldon FT.
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2D Materials‐Based Static Random‐Access Memory
Advanced Materials, 2022Abstract2D transition‐metal dichalcogenide semiconductors, such as MoS2 and WSe2, with adequate bandgaps are promising channel materials for ultrascaled logic transistors. This scalability study of 2D material (2DM)‐based field‐effect transistor (FET) and static random‐access memory (SRAM) cells analyzing the impact of layer thickness reveals that the ...
Yi Wan, Lain-Jong Li, Chih-Pin Lin
exaly +3 more sources
A 128Kb CMOS static random-access memory
IBM Journal of Research and Development, 1991This paper describes an all-CMOS 128Kb static random-access memory (SRAM) with emitter-coupled-logic (ECL) I/O compatibility which was designed for the air-cooled Enterprise System/9000™ processors. Access time of 6.5 ns is achieved using 0.5-µm channel length and 1.0-µm minimum geometry. Pipelining and self-resetting circuit techniques permit the chip
Jeff L. Chu +2 more
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Ultraflexible Monolithic Three-Dimensional Static Random Access Memory
ACS NanoFlexible static random access memory (SRAM) plays an important role in flexible electronics and systems. However, achieving SRAM with a small footprint, high flexibility, and high thermal stability has always been a big challenge. In this work, an ultraflexible six-transistor SRAM with high integration density is realized based on a monolithic three ...
Jiaona Zhang +2 more
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Testing static and dynamic faults in random access memories
Proceedings 20th IEEE VLSI Test Symposium (VTS 2002), 2003The ever increasing trend to reduce DPM levels of memories requires tests with very high fault coverage. The important class of dynamic faults, therefore, cannot be ignored any more. It is shown that conventional memory tests constructed to detect static faulty behavior of a specific defect do not necessarily detect the dynamic faulty behavior. Indeed,
Said Hamdioui +2 more
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