Results 161 to 170 of about 12,742 (221)

Electrical Modeling of STT-MRAM Defects

open access: yes2018 IEEE International Test Conference (ITC), 2018
Spin-transfer-torque magnetic RAM (STT-MRAM) is one of the most promising emerging memory technologies. As various manufacturing vendors make significant efforts to push it to the market, appropriate STT-MRAM testing is of great importance. In this paper, we demonstrate that conventional STT-MRAM defect modeling, which is based on linear resistors, is ...
Lizhou Wu   +4 more
openaire   +2 more sources

Rethinking DRAM's Page Mode With STT-MRAM

IEEE Transactions on Computers, 2023
Byoungchan Oh   +2 more
exaly   +2 more sources

Quantitative Visualization of Thermally Enhanced Perpendicular Shape Anisotropy STT-MRAM Nanopillars [PDF]

open access: yesNano Letters, 2022
Perpendicular shape anisotropy (PSA) offers a practical solution to downscale spin-transfer torque magnetoresistive random-access memory (STT-MRAM) beyond the sub-20 nm technology node while retaining thermal stability.
Trevor P Almeida, S Lequeux, R C Sousa
exaly   +3 more sources

STT-MRAM Sensing: A Review

IEEE Transactions on Circuits and Systems II: Express Briefs, 2021
This brief presents a review of developments in spin-transfer-torque magnetoresistive random access memory (STT-MRAM) sensing over the past 20 years from a circuit design perspective. Various sensing schemes are categorized and described according to the data-cell variation-tolerant characteristics, pre-amplifiers, and offset tolerance.
Taehui Na   +2 more
openaire   +1 more source

Auxiliary Roles in STT-MRAM Memory.

open access: yes, 2014
Computer memories now play a key role in our everyday life given the increase in the number of connected smart devices and wearables. Recently post-CMOS memory technologies are gaining significant research attention along with the regular ones. Spin Transfer Torque Magnetoresistive RAM (STT-MRAM) is one such post-CMOS memory technology with a rapidly ...
Das, Jayita
openaire   +3 more sources

Mitigating Read Failures in STT-MRAM

2020 IEEE 38th VLSI Test Symposium (VTS), 2020
Spin Transfer Torque Magnetic Random Access Memory (STT-MRAM) is an emerging non-volatile memory technology, as a leading candidate to replace conventional on-chip memories due to its various advantages such as high density, non-volatility, scalability, high endurance and CMOS compatibility.
Nair, S. M., Bishnoi, R., Tahoori, M. B.
openaire   +2 more sources

Monitoring Aging Defects in STT-MRAMs

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2020
Identifying manufacturing defects in magnetic tunnel junction (MTJ) device is crucial for the yield and reliability of spin-torque-transfer (STT) magnetic random-access memory (MRAM) arrays. Several of the MTJ defects result inparametric deviations of the device that deteriorate over time.
Govind Radhakrishnan   +2 more
openaire   +1 more source

STT-MRAM for Automotive Applications

2021 IEEE 32nd Magnetic Recording Conference (TMRC), 2021
There is a growing need for fast, endurant, non-volatile solutions for automotive that can meet the harsh requirements of automotive conditions. Automotive applications place severe demands memory devices. In the case of data retention, Automotive Grade 0 requires survival of T ambient 150 °C for 20 years with no loss in data integrity.
K. Nagel   +5 more
openaire   +1 more source

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