Results 1 to 10 of about 13,751 (195)

A novel ultra-steep subthreshold swing iTFET with control gate and control source biasing [PDF]

open access: yesScientific Reports
In this paper, we propose a novel structure with Control Source and Control Gate structured tunnel field-effect transistor (CSCG‑iTFET), which achieves an unprecedentedly steep subthreshold swing (SS) while maintaining high ON-state current ( $$\:{I}_ ...
Jyi-Tsong Lin, Ruei-Cheng Tu
doaj   +2 more sources

Subthreshold Swing in Silicon Gate-All-Around Nanowire and Fully Depleted SOI MOSFETs at Cryogenic Temperature

open access: yesIEEE Journal of the Electron Devices Society, 2021
Subthreshold swing (SS) in a silicon gate-all-around (GAA) nanowire MOSFET with zero body factor is examined from room temperature (RT) down to 4 K. A fully depleted (FD) SOI MOSFET is also evaluated.
Shohei Sekiguchi   +5 more
doaj   +2 more sources

ZrO x Negative Capacitance Field-Effect Transistor with Sub-60 Subthreshold Swing Behavior

open access: yesNanoscale Research Letters, 2021
Here we report the ZrO x -based negative capacitance (NC) FETs with 45.06 mV/decade subthreshold swing (SS) under ± 1 V V GS range, which can achieve new opportunities in future voltage-scalable NCFET applications.
Siqing Zhang   +5 more
doaj   +2 more sources

Effects of channel length on temperature dependence of apparent subthreshold swing in self-aligned top-gate coplanar IGZO thin-film transistors [PDF]

open access: yesScientific Reports
This study investigates how channel length (L) affects the temperature dependence of the apparent subthreshold swing (SS *) in self-aligned top-gate coplanar indium-gallium-zinc oxide (IGZO) thin-film transistors (TFTs).
Chae-Eun Oh   +10 more
doaj   +2 more sources

FS-iTFET: advancing tunnel FET technology with Schottky-inductive source and GAA design [PDF]

open access: yesDiscover Nano
In this paper, we introduce a novel Forkshape nanosheet Inductive Tunnel Field-Effect Transistor (FS-iTFET) featuring a Gate-All-Around structure and a full-line tunneling heterojunction channel.
Jyi-Tsong Lin, Wei-Heng Tai
doaj   +2 more sources

Effect of Gate Length Scaling on Various Performance Parameters in DG-FinFETs: a Simulation Study [PDF]

open access: yesЖурнал нано- та електронної фізики, 2012
This paper presents a simulation study on the gate length scaling of a double gate (DG) FinFET. To achieve channel lengths smaller than 20 nm, innovative device architectures will be necessary to continue the benefits previously acquired through scaling.
Rakesh Vaid, Meenakshi Chandel
doaj   +3 more sources

Dual source negative capacitance GaSb/InGaAsSb/InAs heterostructure based vertical TFET with steep subthreshold swing and high on-off current ratio

open access: yesResults in Physics, 2021
Continuous downscaling of CMOS technology at the nanometer scale with conventional MOSFETs leads to short channel effects (SCE), increased subthreshold slope (SS), and leakage current, degrading the performance of ICs.
Minhaz Uddin Sohag   +5 more
doaj   +1 more source

Low-Power OR Logic Ferroelectric In-Situ Transistor Based on a CuInP2S6/MoS2 Van Der Waals Heterojunction

open access: yesNanomaterials, 2021
Due to the limitations of thermodynamics, the Boltzmann distribution of electrons hinders the further reduction of the power consumption of field-effect transistors.
Kun Yang   +3 more
doaj   +1 more source

Highly Sensitive Detection of Urea Using Si Electrolyte-Gated Transistor with Low Power Consumption

open access: yesBiosensors, 2023
We experimentally demonstrate Si-based electrolyte-gated transistors (EGTs) for detecting urea. The top-down-fabricated device exhibited excellent intrinsic characteristics, including a low subthreshold swing (SS) (~80 mV/dec) and a high on/off current ...
Wonyeong Choi   +6 more
doaj   +1 more source

Improved Subthreshold Characteristics by Back-Gate Coupling on Ferroelectric ETSOI FETs

open access: yesNanoscale Research Letters, 2022
In this work, extremely thin silicon-on-insulator field effective transistors (ETSOI FETs) are fabricated with an ultra-thin 3 nm ferroelectric (FE) hafnium zirconium oxides (Hf0.5Zr0.5O2) layer.
Zhaohao Zhang   +10 more
doaj   +1 more source

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