Results 1 to 10 of about 13,751 (195)
A novel ultra-steep subthreshold swing iTFET with control gate and control source biasing [PDF]
In this paper, we propose a novel structure with Control Source and Control Gate structured tunnel field-effect transistor (CSCG‑iTFET), which achieves an unprecedentedly steep subthreshold swing (SS) while maintaining high ON-state current ( $$\:{I}_ ...
Jyi-Tsong Lin, Ruei-Cheng Tu
doaj +2 more sources
Subthreshold swing (SS) in a silicon gate-all-around (GAA) nanowire MOSFET with zero body factor is examined from room temperature (RT) down to 4 K. A fully depleted (FD) SOI MOSFET is also evaluated.
Shohei Sekiguchi +5 more
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ZrO x Negative Capacitance Field-Effect Transistor with Sub-60 Subthreshold Swing Behavior
Here we report the ZrO x -based negative capacitance (NC) FETs with 45.06 mV/decade subthreshold swing (SS) under ± 1 V V GS range, which can achieve new opportunities in future voltage-scalable NCFET applications.
Siqing Zhang +5 more
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Effects of channel length on temperature dependence of apparent subthreshold swing in self-aligned top-gate coplanar IGZO thin-film transistors [PDF]
This study investigates how channel length (L) affects the temperature dependence of the apparent subthreshold swing (SS *) in self-aligned top-gate coplanar indium-gallium-zinc oxide (IGZO) thin-film transistors (TFTs).
Chae-Eun Oh +10 more
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FS-iTFET: advancing tunnel FET technology with Schottky-inductive source and GAA design [PDF]
In this paper, we introduce a novel Forkshape nanosheet Inductive Tunnel Field-Effect Transistor (FS-iTFET) featuring a Gate-All-Around structure and a full-line tunneling heterojunction channel.
Jyi-Tsong Lin, Wei-Heng Tai
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Effect of Gate Length Scaling on Various Performance Parameters in DG-FinFETs: a Simulation Study [PDF]
This paper presents a simulation study on the gate length scaling of a double gate (DG) FinFET. To achieve channel lengths smaller than 20 nm, innovative device architectures will be necessary to continue the benefits previously acquired through scaling.
Rakesh Vaid, Meenakshi Chandel
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Continuous downscaling of CMOS technology at the nanometer scale with conventional MOSFETs leads to short channel effects (SCE), increased subthreshold slope (SS), and leakage current, degrading the performance of ICs.
Minhaz Uddin Sohag +5 more
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Due to the limitations of thermodynamics, the Boltzmann distribution of electrons hinders the further reduction of the power consumption of field-effect transistors.
Kun Yang +3 more
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Highly Sensitive Detection of Urea Using Si Electrolyte-Gated Transistor with Low Power Consumption
We experimentally demonstrate Si-based electrolyte-gated transistors (EGTs) for detecting urea. The top-down-fabricated device exhibited excellent intrinsic characteristics, including a low subthreshold swing (SS) (~80 mV/dec) and a high on/off current ...
Wonyeong Choi +6 more
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Improved Subthreshold Characteristics by Back-Gate Coupling on Ferroelectric ETSOI FETs
In this work, extremely thin silicon-on-insulator field effective transistors (ETSOI FETs) are fabricated with an ultra-thin 3 nm ferroelectric (FE) hafnium zirconium oxides (Hf0.5Zr0.5O2) layer.
Zhaohao Zhang +10 more
doaj +1 more source

