Role of the channel on the memory window of HfZrO<sub>x</sub> ferroelectric field-effect transistors with p-type Si-doped InZnO<sub>x</sub> channel. [PDF]
Park H, Lim S, Lee S, Lee JW, Woo J.
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High-Performance Air-Stable Polymer Monolayer Transistors for Monolithic 3D CMOS logics. [PDF]
Cheng M +13 more
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Threshold-Voltage Modulation and N<sub>2</sub>O Plasma Passivation for Enhanced Retention and Memory Window in Capacitorless 2T0C DRAM Oxide Thin-Film Transistors. [PDF]
Yang C, Lee M, Han J, Nam S.
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Performance Assessment of Ultrascaled Vacuum Gate Dielectric MoS2 Field-Effect Transistors: Avoiding Oxide Instabilities in Radiation Environments. [PDF]
Tamersit K +3 more
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Tunneling Field-Effect Transistors (TFETs) With Subthreshold Swing (SS) Less Than 60 mV/dec
IEEE Electron Device Letters, 2007We have demonstrated a 70-nm n-channel tunneling field-effect transistor (TFET) which has a subthreshold swing (SS) of 52.8 mV/dec at room temperature. It is the first experimental result that shows a sub-60-mV/dec SS in the silicon-based TFETs. Based on simulation results, the gate oxide and silicon-on-insulator layer thicknesses were scaled down to 2
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Abstract We investigate the physical mechanism linking subthreshold swing (SS) degradation and SS saturation in cryogenic n-type gate-all-around (GAA) metal-oxide-semiconductor field-effect transistors (MOSFETs). While previous studies attributed SS saturation to source-to-drain direct tunneling (SDDT), we clarify that SDDT alone does ...
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Power efficient transistors with low subthreshold swing using abrupt switching devices
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