A Stepped-Spacer FinFET Design for Enhanced Device Performance in FPGA Applications. [PDF]
Micromachines (Basel)Zareiee M, Mehrad M, Tawfik A.
europepmc +1 more source
The Effects of High-Energy Carbon Co-Doping on IMB-CNM LGAD Fabrication and Performance. [PDF]
Sensors (Basel)Villegas J +5 more
europepmc +1 more source
Enhancing InGaZnO transistor current through high-κ dielectrics and interface trap extraction using single-pulse charge pumping. [PDF]
Sci RepPark J +9 more
europepmc +1 more source
A Novel ELISA System for Measuring Modified LDL-Adiponectin Complex. [PDF]
J Atheroscler ThrombSasaoka M +10 more
europepmc +1 more source
Universal Logic-in-Memory Gates Using Reconfigurable Silicon Transistors. [PDF]
Micromachines (Basel)Kim S, Kim N, Ko Y, Lim D.
europepmc +1 more source
Experiment and Analysis of Termination Robustness Design for 1200 V 4H-SiC MOSFET. [PDF]
Nanomaterials (Basel)Yu M, Shen Y, Ma H, Zhang Q.
europepmc +1 more source
The Study of the Transient Dose Rate Effect on ROIC Pixels in Ultra-Large-Scale Infrared Detectors. [PDF]
Micromachines (Basel)Liu Y +6 more
europepmc +1 more source
Modeling trap dynamics in oxide-engineered heterostructure TFETs for breast cancer detection. [PDF]
Sci RepGhosh R, Saha P.
europepmc +1 more source
Related searches:
Using TCAD tools, many reliability issues can be studied quantitatively. Examples are hot carrier degradation of interfaces, threshold voltage shifts during NBTI stress, radiation effects and soft errors, ESD and latch-up, thermo-mechanical issues, electro-migration and stress-voiding.
P. Pfäffli +7 more
openaire +1 more source