Temperature-Dependent Reverse-Recovery Behavior Analysis and Circuit-Level Mitigation of Superjunction MOSFETs. [PDF]
Cui W +6 more
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Extraction of Electron and Hole Drift Velocities in Thin 4H-SiC PIN Detectors Using High-Frequency Readout Electronics. [PDF]
Gsponer A +7 more
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Incorporation of Temperature Impact on Hot-Carrier Degradation into Compact Physics Model. [PDF]
Tyaginov S +9 more
europepmc +1 more source
Characteristics Prediction and Optimization of GaN CAVET Using a Novel Physics-Guided Machine Learning Method. [PDF]
Wu W, Wang J, Su J, Chen Z, Yu Z.
europepmc +1 more source
Nanogate ferroelectric transistors with ultralow operation voltage of 0.6 V. [PDF]
Meng D +5 more
europepmc +1 more source
Incremental Pulse-Width Erase (IPWE) Scheme for Fast and Variation-Tolerant GIDL Erase of 3D NAND Flash. [PDF]
Park Y, Shim W.
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Channel and Body-Diode Conduction Characteristics in 4H-SiC MOSFETs Under Third-Quadrant Switching Conditions. [PDF]
Huang X, Song Y, Zhong C, Wang Z.
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Simulation Study of Enhancement-Mode <i>β</i>-Ga<sub>2</sub>O<sub>3</sub> MOSFETs on a Novel P-Ga<sub>2</sub>O<sub>3</sub>/AlN/SiC Substrate. [PDF]
Lu W +5 more
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