Results 161 to 170 of about 5,000 (223)

Reliability assessment of Z-shaped gate TFET under interface trap charges and thermal variations for low-power applications. [PDF]

Sci Rep
Ashok T, Pandey CK.
europepmc   +1 more source

Simulation Study of Enhancement-Mode <i>β</i>-Ga₂O₃ MOSFETs on a Novel P-Ga₂O₃/AlN/SiC Substrate. [PDF]

Micromachines (Basel)
Lu W, Zhou C, Wang D, Liu Y, Wang P, Wang G.   +5 more
europepmc   +1 more source

Transient Charge Collection in Ultra-Thin SiC Membranes for Single-Ion Detection. [PDF]

Sensors (Basel)
Sangregorio E, Mancuso AS, De Luca S, Muoio A, Calcagno L, La Via F.   +5 more
europepmc   +1 more source

Role of mechanical stress on the electrothermal and OFF state current in scaled FinFET devices. [PDF]

Sci Rep
Shubham, Pandey RK.
europepmc   +1 more source

Combining quasi-one-dimensional modeling with region-wise structure analysis for rapid technology computer-aided design simulations of gate-all-around MOSFETs. [PDF]

Commun Eng
Lee KW, Kim IK, Jung SW, Jang MS, Hong SM.   +4 more
europepmc   +1 more source

Partition Noise Extraction Using TCAD Simulations

, 2019
openaire   +2 more sources

The electrical characteristics of Nanosheet FET within the quasi-ballistic transport: Role of scattering and temperature variation. [PDF]

PLoS One
Shubham, Pandey RK.
europepmc   +1 more source

Multiscale Design and Simulation of CdSe/ZnS/MoTe₂ Hybrid Photodetectors. [PDF]

Sensors (Basel)
Hussain S, Liu Y, Wazir N, Krishna K, Tao L.   +4 more
europepmc   +1 more source

Pre-Silicon Accurate SPICE Modeling of Trench MOSFETs via Advanced TCAD Simulations and Dynamic Validation. [PDF]

Micromachines (Basel)
Tariq A, Minardi G, Cinnera Martino V, Fazio E, Rinaudo S, Privitera G, Neri F, Corsaro C.   +7 more
europepmc   +1 more source

Temperature-Dependent Reverse-Recovery Behavior Analysis and Circuit-Level Mitigation of Superjunction MOSFETs. [PDF]

Micromachines (Basel)
Cui W, Liao P, Wang Y, Guo J, Yang Y, Zhang DW, Xu H.   +6 more
europepmc   +1 more source