Results 71 to 80 of about 341 (156)

The Effect of BEOL Design Factors on the Thermal Reliability of Flip-Chip Chip-Scale Packaging. [PDF]

open access: yesMicromachines (Basel)
Li D   +8 more
europepmc   +1 more source

750 V Breakdown in GaN Buffer on 200 mm SOI Substrates Using Reverse-Stepped Superlattice Layers. [PDF]

open access: yesMicromachines (Basel)
You S   +11 more
europepmc   +1 more source

A review of glass thermal reflow: method, device, and applications. [PDF]

open access: yesMicrosyst Nanoeng
Zhu M   +13 more
europepmc   +1 more source

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