Results 61 to 70 of about 2,113 (167)

Dependability Assessment of NAND Flash-memory for Mission-critical Applications [PDF]

It is a matter of fact that NAND flash memory devices are well established in consumer market. However, it is not true that the same architectures adopted in the consumer market are suitable for mission critical applications like space.
Fabiano, Michele
core  

A TID and SEE Characterization of Multi-Terabit COTS 3D NAND Flash [PDF]

Single-event effects and total ionizing dose testing is described for a 32-layer NAND flash memory, in both SLC and MLC configurations, with special considerations for unique three-dimensional test ...
Campola, Michael J., Wilcox, Edward P.
core   +1 more source

Overview of emerging nonvolatile memory technologies [PDF]

, 2014

core   +1 more source

Boosting the Performance of 3D Charge Trap NAND Flash with Asymmetric Feature Process Size Characteristic [PDF]

[[notice ...
Chen, Shuo Han
core  

Characterizing and Optimizing LDPC Performance on 3D NAND Flash Memories

ACM Transactions on Architecture and Code Optimization
With the development of NAND flash memories’ bit density and stacking technologies, while storage capacity keeps increasing, the issue of reliability becomes increasingly prominent. Low-density parity check (LDPC) code, as a robust error-correcting code, is extensively employed in flash memory.
Qiao Li, Yu Chen, Guanyu Wu, Yajuan Du, Min Ye, Xinbiao Gan, Jie Zhang, Zhirong Shen, Jiwu Shu, Chun Xue   +9 more
openaire   +1 more source

Editorial for the Special Issue on Flash Memory Devices. [PDF]

Micromachines (Basel), 2021
Zambelli C, Micheloni R.
europepmc   +1 more source

Controlling the Carrier Injection Efficiency in 3D Nanocrystalline Silicon Floating Gate Memory by Novel Design of Control Layer. [PDF]

Nanomaterials (Basel), 2023
Hu H, Ma Z, Yu X, Chen T, Zhou C, Li W, Chen K, Xu J, Xu L.   +8 more
europepmc   +1 more source

Embedding security into ferroelectric FET array via in situ memory operation. [PDF]

Nat Commun, 2023
Xu Y, Xiao Y, Zhao Z, Müller F, Vardar A, Gong X, George S, Kämpfe T, Narayanan V, Ni K.   +9 more
europepmc   +1 more source

Highly-scaled and fully-integrated 3-dimensional ferroelectric transistor array for hardware implementation of neural networks. [PDF]

Nat Commun, 2023
Kim IJ, Kim MK, Lee JS.
europepmc   +1 more source

FinFET 6T-SRAM All-Digital Compute-in-Memory for Artificial Intelligence Applications: An Overview and Analysis. [PDF]

Micromachines (Basel), 2023
Gul W, Shams M, Al-Khalili D.
europepmc   +1 more source