Results 31 to 40 of about 3,221,776 (178)
The application of neuMOS transistors to enhanced Built-in Self-Test (BIST) and product quality [PDF]
, 1999 The neuMOS transistor is a comparatively new device developed in 1991 at Tohoku University, Japan, which is currently showing great promise in the direction of enhanced circuit functionality, particularly in Neural Network applications.
Richardson, Andrew, Nicholson, Richard
core +4 more sources
Electronics Letters, 2021 Here, a 4‐level pulse amplitude modulation direct decision feedback equaliser (DFE) with a novel dynamic current‐mode‐logic comparator (DCMLC) is presented.
Dengjie Wang +5 more
doaj +1 more source
Ultra‐low line sensitivity and high PSRR sub‐threshold CMOS voltage reference
The Journal of Engineering, 2023 This paper presents a nanowatt CMOS voltage reference (VR) with ultra‐low line sensitivity (LS) and high‐power supply ripple rejection (PSRR). The proposed VR consists of two simple nanowatt two‐transistor (2T) VRs.
Mohammad Rashtian
doaj +1 more source
Reconfiguration based built-in self-test for analogue front-end circuits [PDF]
, 1999 Previous work has shown that it is feasible to implement a fully digital test evaluation function to realise partial self-test on an automatic gain control circuit (AGC).
Lechner, Andreas +2 more
core +4 more sources
Electronics Letters, 2022 This letter presents two transient enhancement techniques for multi‐path switched‐capacitor‐inductor (MP‐SCI) hybrid DC–DC converters to eliminate the line‐transient‐induced voltage coupling to the converter output.
Huihua Li +5 more
doaj +1 more source
Analogue integrated-circuit design for sustainedneurons in a fly
Electronics Letters, 2001 An analogue integrated-circuit design of a fly's sustained neurons is presented. Circuit simulation of the design shows that the output exhibits non-associative learning in agreement with electrophysiological studies of these neurons. The output is shown to encode the contrast of the input.
G.B. Zhang +3 more
openaire +1 more source
A design-for-test structure for optimising analogue and mixed signal IC test [PDF]
, 1995 A new Design-for-Test (DfT) structure based on a configurable operational amplifier, referred to as a “swap amp” is presented that allows access to embedded analogue blocks.
Dorey, A. P. +7 more
core +4 more sources
The Journal of EngineeringA two‐stage Class A‐AB operational transconductance amplifier with low power consumption, high slew rate, and high bandwidth is introduced for handling large capacitive loads. Unlike the conventional two‐stage operational transconductance amplifiers that
Mohammad Rashtian +2 more
doaj +1 more source
On comparison of constrained and unconstrained evolutions in analogue electronics on the example of “LC” low-pass filters [PDF]
, 2006 The Evolutionary Electronics refers to the design method of electronic circuits with the help of Evolutionary Algorithms. Over the years huge experience has been accumulated and tremendous results have been achieved in this field.
Kalganova, T, Sapargaliyev, Y
core +4 more sources
A 190.3‐dBc/Hz FoM 16‐GHz rotary travelling‐wave oscillator with reliable direction control
Electronics Letters, 2021 This letter presents a rotary travelling‐wave oscillator (RTWO) with reliable direction control in a standard 130 nm complementary metal–oxide–semiconductor (CMOS) technology.
Fangzhou Sun +3 more
doaj +1 more source