Results 101 to 110 of about 573 (171)
Group IV based tunnel field-effect transistors generally show lower on-current than III-V based devices because of the weaker phonon-assisted tunneling transitions in the group IV indirect bandgap materials.
Soree, Bart +6 more
core +1 more source
Proposal for Graphene-Boron Nitride Heterobilayer-Based Tunnel FET
We investigate the gate-controlled direct band-to-band tunneling (BTBT) current in a graphene-boron nitride (G-BN) heterobilayer channel-based tunnel field effect transistor.
Ghosh, Ram Krishna, Mahapatra, Santanu
core +1 more source
Leakage Minimization Technique for Nanoscale CMOS VLSI
Because of the continued scaling of technology and supply-threshold voltage, leakage power has become more significant in power dissipation of nanoscale CMOS circuits.
Park, Nohpill +3 more
core +1 more source
Experimental demonstration of planar SiGe on Si TFETs with counter doped pocket
This paper presents both experimental and TCAD simulation results on a planar tunneling field-effect transistor (TFET) using compressively strained Si0.45Ge0.55 on Si. Introducing a counter doped pocket at the source tunnel junction in combination with a
Trellenkamp, S. +13 more
core +1 more source
Physical investigation of strained Si nanowire band to band tunneling transistors and inverters
The demand for continuous improvement of computation speed, power efficiency and complexity of logic circuits made of metal-oxide-semiconductor field-effect-transistors (MOSFET) has been satised over a few decades by scaling the device dimensions ...
Knoll, Lars
core
Area and Energy-Efficient Quantum Tunneling-Based Thermal Sensor on 45nm RFSOI Technology
The compact and energy-efficient integrated temperature sensors are crucial for temperature monitoring and control. In this work, we propose a novel area and energy-efficient band-to-band tunneling (BTBT)-based oscillator for temperature sensing ...
Sonawane, Jay +9 more
core +1 more source
Role of mechanical stress on the electrothermal and OFF state current in scaled FinFET devices. [PDF]
Shubham, Pandey RK.
europepmc +1 more source
The potential of van der Waals (vdW) heterostructure to incorporate the outstanding features of stacked materials to meet various application requirements has drawn considerable attention.
Ferdous, Naim
core
In-cell bypass diodes for high-efficiency and shading-tolerant back contact silicon photovoltaic modules. [PDF]
Tang H +9 more
europepmc +1 more source
Suppressing Gate-Induced Drain Leakage with an Asymmetric Gate Design in HiPco CNT FETs. [PDF]
Ma H, Gu S, Zhai M, Liu H.
europepmc +1 more source

