Results 21 to 30 of about 61,923 (261)
IEEE Journal of the Electron Devices Society, 2018 Metal/ferroelectric-Si:HfO2/SiN/SiO2/Si structure was fabricated to investigate the charge trapping properties. This device enhances the carrier injection into the nitride from the silicon due to the spontaneous polarization in SiO2:HfO2 layer.
Hao Ji +3 more
doaj +1 more source
Charge Carrier Trapping during Diffusion Generally Observed for Particulate Photocatalytic Films
Energies, 2021 Photo-excited charge carriers play a vital role in photocatalysts and photovoltaics, and their dynamic processes must be understood to improve their efficiencies by controlling them.
Kenji Katayama +2 more
doaj +1 more source
Effect of inlet valve timing and water blending on bioethanol HCCI combustion using forced induction and residual gas trapping [PDF]
, 2008 This is the post-print version of the final paper published in Fuel. The published article is available from the link below. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other ...
Yap, D +3 more
core +1 more source
Advances in Condensed Matter Physics, 2018 Method for characterization of electrical and trapping properties of multilayered high permittivity stacks for use in charge trapping flash memories is proposed. Application of the method to the case of multilayered HfO2/Al2O3 stacks is presented.
Nenad Novkovski +3 more
doaj +1 more source
Nitrogen‐Doped Carbon Quantum Dots on Graphene for Field‐Effect Transistor Optoelectronic Memories
Advanced Electronic Materials, 2023 The development of field‐effect transistor‐based (FET‐based) non‐volatile optoelectronic memories is vital toward innovations necessary to improve computer systems.
Mahima Chaudhary +8 more
doaj +1 more source
Zinc-oxide charge trapping memory cell with ultra-thin chromium-oxide trapping layer
AIP Advances, 2013 A functional zinc-oxide based SONOS memory cell with ultra-thin chromium oxide trapping layer was fabricated. A 5 nm CrO2 layer is deposited between Atomic Layer Deposition (ALD) steps.
Nazek El-Atab +3 more
doaj +1 more source
Imaging Fermi-level hysteresis in nanoscale bubbles of few-layer MoS2
Communications Materials, 2023 The electrical stability and reliability of two-dimensional (2D) crystal-based devices are mainly determined by charge traps in the device defects. Although nanobubble structures as defect sources in 2D materials strongly affect the device performance ...
Dohyeon Jeon +3 more
doaj +1 more source
Excitation Energy Transfer and Trapping in Higher Plant Photosystem II Complexes with Different Antenna Sizes [PDF]
, 2011 700 cm(-1)) and a slow relaxation of the radical pair to an irreversible state (similar to 150 ps). Somewhat unexpectedly, we had to reduce the energy-transfer and charge-separation rates in complexes with decreasing size to obtain optimal fits.
van Amerongen, H. +14 more
core +1 more source
Nanoscale Research Letters, 2017 In this work, high-k composite TiAlO film has been investigated as charge-trapping material for nonvolatile memory applications. The annealing formed Al2O3-TiAlO-SiO2 dielectric stack demonstrates significant memory effects and excellent reliability ...
Wenchao Xu +11 more
doaj +1 more source
Impact of mechanical deformation on space charge in XLPE [PDF]
, 2007 In this paper we report the effect of mechanical deformation on space charge dynamics in crosslinked polyethylene. Thin films were peeled from a 66 kV commercial XLPE cable. Space charge measurements under dc electric fields have been monitored using the
Kamaruzzaman, M. R. +3 more
core +1 more source