Results 21 to 30 of about 50,543 (262)
A computational study on the charge-trapping characteristics of nano-silica-doped polydimethylsiloxane composites [PDF]
Widely used as an insulating material in power cables, polydimethylsiloxane (PDMS) requires improved dielectric properties. Doping with nanoparticles is recognized as a feasible modification method, in which changes in charge-trapping characteristics are
Yong Yang +6 more
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Investigating charge trapping in ferroelectric thin films through transient measurements
A measurement technique is presented to quantify the polarization loss in ferroelectric thin films as a function of delay time during the first 100s after switching. This technique can be used to investigate charge trapping in ferroelectric thin films by
Suzanne Lancaster +7 more
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Metal/ferroelectric-Si:HfO2/SiN/SiO2/Si structure was fabricated to investigate the charge trapping properties. This device enhances the carrier injection into the nitride from the silicon due to the spontaneous polarization in SiO2:HfO2 layer.
Hao Ji +3 more
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Charge Carrier Trapping during Diffusion Generally Observed for Particulate Photocatalytic Films
Photo-excited charge carriers play a vital role in photocatalysts and photovoltaics, and their dynamic processes must be understood to improve their efficiencies by controlling them.
Kenji Katayama +2 more
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Method for characterization of electrical and trapping properties of multilayered high permittivity stacks for use in charge trapping flash memories is proposed. Application of the method to the case of multilayered HfO2/Al2O3 stacks is presented.
Nenad Novkovski +3 more
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Nitrogen‐Doped Carbon Quantum Dots on Graphene for Field‐Effect Transistor Optoelectronic Memories
The development of field‐effect transistor‐based (FET‐based) non‐volatile optoelectronic memories is vital toward innovations necessary to improve computer systems.
Mahima Chaudhary +8 more
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Zinc-oxide charge trapping memory cell with ultra-thin chromium-oxide trapping layer
A functional zinc-oxide based SONOS memory cell with ultra-thin chromium oxide trapping layer was fabricated. A 5 nm CrO2 layer is deposited between Atomic Layer Deposition (ALD) steps.
Nazek El-Atab +3 more
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Imaging Fermi-level hysteresis in nanoscale bubbles of few-layer MoS2
The electrical stability and reliability of two-dimensional (2D) crystal-based devices are mainly determined by charge traps in the device defects. Although nanobubble structures as defect sources in 2D materials strongly affect the device performance ...
Dohyeon Jeon +3 more
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In this work, high-k composite TiAlO film has been investigated as charge-trapping material for nonvolatile memory applications. The annealing formed Al2O3-TiAlO-SiO2 dielectric stack demonstrates significant memory effects and excellent reliability ...
Wenchao Xu +11 more
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Methods and Applications in Trapped Charge Dating [PDF]
Trapped charge dating is a commonly used chronological tool in Earth Sciences and Archaeology. The two principle methods are luminescence dating and electron spin resonance. Both are based on stored energy produced by the absorption of natural radioactivity in common minerals such as quartz and feldspars and in some biological materials such as tooth ...
openaire +3 more sources

