Results 41 to 50 of about 50,543 (262)

Structural studies and functional engineering of NanX: an anhydro‐sialic acid transporter from Escherichia coli

open access: yesFEBS Open Bio, EarlyView.
Biophysical characterisation shows that NanX, a membrane transport protein from the major facilitator superfamily (MFS), forms both monomers and dimers after purification. AlphaFold modelling and substrate docking provide information on residues likely involved in substrate recognition for NanX and another MFS member, NanT.
Michael C. Newton‐Vesty   +13 more
wiley   +1 more source

Transverse Scaling of Schottky Barrier Charge-Trapping Cells for Energy-Efficient Applications

open access: yesCrystals, 2020
This work numerically elucidates the effects of transverse scaling on Schottky barrier charge-trapping cells for energy-efficient applications. Together with the scaled gate structures and charge-trapping dielectrics, variations in bias conditions on ...
Hung-Jin Teng   +5 more
doaj   +1 more source

Karl Popper and the Mechanisms of Hydrogen Embrittlement

open access: yesAdvanced Engineering Materials, EarlyView.
Representation of the beginning of loss of ductility rather than embrittlement. Small concentrations of hydrogen in a diffusible form within iron are well‐established to harm the mechanical integrity of steels. There are theories that attempt to explain the pernicious role of hydrogen.
H. K. D. H. Bhadeshia
wiley   +1 more source

High‐Performance Nonvolatile Organic Field‐Effect Transistor Memory Based on Organic Semiconductor Heterostructures of Pentacene/P13/Pentacene as Both Charge Transport and Trapping Layers

open access: yesAdvanced Science, 2017
Nonvolatile organic field‐effect transistor (OFET) memory devices based on pentacene/N,N′‐ditridecylperylene‐3,4,9,10‐tetracarboxylic diimide (P13)/pentacene trilayer organic heterostructures have been proposed. The discontinuous n‐type P13 embedded in p‐
Wen Li   +8 more
doaj   +1 more source

Investigations on the effect of ageing on charge de-trapping processes of epoxy–alumina nanocomposites based on isothermal relaxation current measurements

open access: yesIET Nanodielectrics, 2020
In this study, the relationship between thermal ageing and charge trapping properties of epoxy-based nanocomposites has been investigated. With ageing, any dielectric material undergoes thorough degradation.
Subhajit Maur   +7 more
doaj   +1 more source

Hydrogen‐Assisted Fracture of Iron‐Based Fe–Ni–Al Alloys

open access: yesAdvanced Engineering Materials, EarlyView.
Principal relations and fracture mechanisms of single‐phase and precipitate‐strengthened Fe–Ni–Al alloys subjected to prior electrochemical hydrogen charging are identified. The mechanisms of hydrogen effect on strength and microhardness are discussed, including hydrogen‐induced increase in microhardness and the role of hydrogen in fracture behavior ...
Nataliya Yadzhak   +3 more
wiley   +1 more source

Over- and Undercoordinated Atoms as a Source of Electron and Hole Traps in Amorphous Silicon Nitride (a-Si3N4)

open access: yesNanomaterials, 2023
Silicon nitride films are widely used as the charge storage layer of charge trap flash (CTF) devices due to their high charge trap densities. The nature of the charge trapping sites in these materials responsible for the memory effect in CTF devices is ...
Christoph Wilhelmer   +5 more
doaj   +1 more source

Molecular Dynamics Studies of Shape Memory Polymers: From Bead–Spring Models to Atomistic Simulations

open access: yesAdvanced Engineering Materials, EarlyView.
Coarse‐grained (left) and atomistic (right) models of the shape memory polymer ESTANE ETE 75DT3 are shown schematically. The two representations bridge molecular detail and mesoscopic description. Both models capture shape memory behavior, linking segmental mobility and conformational relaxation of anisotropic chains to macroscopic recovery, and ...
Fathollah Varnik
wiley   +1 more source

Coupling effects of interface charge trapping and polarization switching in HfO2-based ferroelectric field effect transistors

open access: yesAPL Materials
HfO2-based ferroelectric field-effect transistors (FeFETs) are regarded as one of the most promising non-volatile memory technologies in the future. However, the charge trapping phenomenon during the program/erase operation is still a challenge.
Tianqi Hao   +8 more
doaj   +1 more source

Characteristics of Surface Charge Accumulation on Direct Current GIL Insulators Under Different Dominant Mechanisms Considering Surface Trapping Effect

open access: yesShanghai Jiaotong Daxue xuebao
The existing mathematical models for charge accumulation at the gas-solid interface can hardly illustrate some microscopic mechanisms, which need improvement.
WANG Yaogang, WANG Zheming, LI Ke, JIA Bowen, YANG Hua, YAN Wu, LU Wu
doaj   +1 more source

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