Results 91 to 100 of about 14,575 (156)
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Mechanisms of the Chemical Mechanical Polishing (CMP) Process in Integrated Circuit Fabrication
CIRP Annals, 2001Abstract A contact mechanics model that describes the polishing mechanisms of copper-patterned silicon wafers in the fabrication of ultra-large-scale integrated (ULSI) circuits is presented. The model explains the die-scale variation of material removal rates due to pattern geometry, and predicts results that are in agreement with experimental ...
N. Saka, J. Lai, J. Chun, Nam P. Sun
semanticscholar +2 more sources
Strategies for Optimal Chemical Mechanical Polishing (CMP) Slurry Design
Journal of Dispersion Science and Technology, 2003Abstract Chemical mechanical polishing (CMP) has become the preferred route for achieving wafer‐level global planarization in microelectronics device manufacturing. However, the micro‐ to molecular‐level mechanisms that control its performance and optimization are not well understood.
G. Bahar Basim +3 more
semanticscholar +2 more sources
Models of nanoparticles movement, collision, and friction in chemical mechanical polishing (CMP)
Journal of Nanoparticle Research, 2012Nanoparticles have been widely used in polishing slurry such as chemical mechanical polishing (CMP) process. The movement of nanoparticles in polishing slurry and the interaction between nanoparticles and solid surface are very important to obtain an atomic smooth surface in CMP process.
F. Ilie
semanticscholar +2 more sources
Abrasive-free and ultra-low abrasive chemical mechanical polishing (CMP) processes
Advances in Chemical Mechanical Planarization (CMP), 2022As the semiconductors industry changes, several novel materials are being introduced into the integration scheme both in the interconnect and transistor regions, and new chemical mechanical polishing/planarization (CMP) steps are being introduced.
N. K. Penta
semanticscholar +1 more source
Investigation on Surface Hardening of Polyurethane Pads During Chemical Mechanical Polishing (CMP)
Journal of Electronic Materials, 2010Taesung Kim, Ji Chul Yang, Kim Taesung
exaly +2 more sources

