Results 21 to 30 of about 7,307,662 (147)
This paper proposes a cross-scale simulation approach for evaluating the steady-state electrothermal performance of power MOSFETs at the device–package–heatsink–board (DPHB) level.
Yuxuan Dai +9 more
doaj +1 more source
Sensitivity Study of Polysilicon Nanowire Based on Scattering and Quantum Mechanics Models
In this paper, we report nanowire drain saturation current sensitivity property to measure femtomol level change in drain current due to different proteins i.e.
Aanand +5 more
doaj +1 more source
Correlated Time-0 and Hot-Carrier Stress Induced FinFET Parameter Variabilities: Modeling Approach
We identify correlation between the drain currents in pristine n-channel FinFET transistors and changes in time-0 currents induced by hot-carrier stress.
Alexander Makarov +7 more
doaj +1 more source
Channel Engineering for Nanotransistors in a Semiempirical Quantum Transport Model
One major concern of channel engineering in nanotransistors is the coupling of the conduction channel to the source/drain contacts. In a number of previous publications, we have developed a semiempirical quantum model in quantitative agreement with three
Ulrich Wulf +5 more
doaj +1 more source
Eight Questions about Brain Drain [PDF]
High-skilled emigration is an emotive issue that in popular discourse is often referred to as brain drain, conjuring images of extremely negative impacts on developing countries. Recent discussions of brain gain, diaspora effects, and other advantages of
John Gibson, David McKenzie
core +4 more sources
Simulation Study of the Double-Gate Tunnel Field-Effect Transistor with Step Channel Thickness
Double-gate tunnel field-effect transistor (DG TFET) is expected to extend the limitations of leakage current and subthreshold slope. However, it also suffers from the ambipolar behavior with the symmetrical source/drain architecture.
Maolin Zhang +4 more
doaj +1 more source
Low saturation voltages and extremely high intrinsic gain can be achieved in contact‐controlled thin‐film transistors (TFTs) with staggered device architecture, enabled by the energy barrier introduced at the source contact.
Eva Bestelink +4 more
doaj +1 more source
Magnetically-coupled Current Sensor Using An Integrated Coil And A Cmos Split-drain Transistor
An integrated current sensing circuit intended for Smart-Power and embedded applications featuring galvanic isolation is implemented. It is based on magnetic detection using the CMOS compatible Split- Drain transistor (MAGFET) that provides a very ...
Fernando C. Castaldo +1 more
doaj +1 more source
Controlling Drain Side Tunneling Barrier Width in Electrically Doped PNPN Tunnel FET
In this paper, we propose and investigate an electrically doped (ED) PNPN tunnel field effect transistor (FET), in which the drain side tunneling barrier width is effectively controlled to obtain a suppressed ambipolar current.
Chan Shan +4 more
doaj +1 more source
Vertical thin-film transistors (V-TFTs) with an InSnO-stabilized ZnO channel were fabricated. The vertical architecture enables devices with submicron channel lengths (≤500 nm) to afford delivering drain current greatly exceeding that of conventional ...
Xue-Mei Yin +4 more
doaj +1 more source

