Results 21 to 30 of about 7,307,662 (147)

A Cross-Scale Electrothermal Co-Simulation Approach for Power MOSFETs at Device–Package–Heatsink–Board Levels

open access: yesMicromachines
This paper proposes a cross-scale simulation approach for evaluating the steady-state electrothermal performance of power MOSFETs at the device–package–heatsink–board (DPHB) level.
Yuxuan Dai   +9 more
doaj   +1 more source

Sensitivity Study of Polysilicon Nanowire Based on Scattering and Quantum Mechanics Models

open access: yesMATEC Web of Conferences, 2018
In this paper, we report nanowire drain saturation current sensitivity property to measure femtomol level change in drain current due to different proteins i.e.
Aanand   +5 more
doaj   +1 more source

Correlated Time-0 and Hot-Carrier Stress Induced FinFET Parameter Variabilities: Modeling Approach

open access: yesMicromachines, 2020
We identify correlation between the drain currents in pristine n-channel FinFET transistors and changes in time-0 currents induced by hot-carrier stress.
Alexander Makarov   +7 more
doaj   +1 more source

Channel Engineering for Nanotransistors in a Semiempirical Quantum Transport Model

open access: yesMathematics, 2017
One major concern of channel engineering in nanotransistors is the coupling of the conduction channel to the source/drain contacts. In a number of previous publications, we have developed a semiempirical quantum model in quantitative agreement with three
Ulrich Wulf   +5 more
doaj   +1 more source

Eight Questions about Brain Drain [PDF]

open access: yes
High-skilled emigration is an emotive issue that in popular discourse is often referred to as brain drain, conjuring images of extremely negative impacts on developing countries. Recent discussions of brain gain, diaspora effects, and other advantages of
John Gibson, David McKenzie
core   +4 more sources

Simulation Study of the Double-Gate Tunnel Field-Effect Transistor with Step Channel Thickness

open access: yesNanoscale Research Letters, 2020
Double-gate tunnel field-effect transistor (DG TFET) is expected to extend the limitations of leakage current and subthreshold slope. However, it also suffers from the ambipolar behavior with the symmetrical source/drain architecture.
Maolin Zhang   +4 more
doaj   +1 more source

Extraordinarily Weak Temperature Dependence of the Drain Current in Small‐Molecule Schottky‐Contact‐Controlled Transistors through Active‐Layer and Contact Interplay

open access: yesAdvanced Electronic Materials, 2023
Low saturation voltages and extremely high intrinsic gain can be achieved in contact‐controlled thin‐film transistors (TFTs) with staggered device architecture, enabled by the energy barrier introduced at the source contact.
Eva Bestelink   +4 more
doaj   +1 more source

Magnetically-coupled Current Sensor Using An Integrated Coil And A Cmos Split-drain Transistor

open access: yesEletrônica de Potência, 2006
An integrated current sensing circuit intended for Smart-Power and embedded applications featuring galvanic isolation is implemented. It is based on magnetic detection using the CMOS compatible Split- Drain transistor (MAGFET) that provides a very ...
Fernando C. Castaldo   +1 more
doaj   +1 more source

Controlling Drain Side Tunneling Barrier Width in Electrically Doped PNPN Tunnel FET

open access: yesMicromachines, 2023
In this paper, we propose and investigate an electrically doped (ED) PNPN tunnel field effect transistor (FET), in which the drain side tunneling barrier width is effectively controlled to obtain a suppressed ambipolar current.
Chan Shan   +4 more
doaj   +1 more source

Effect of source–drain contact and channel length on the performance of vertical thin-film transistors

open access: yesAIP Advances, 2023
Vertical thin-film transistors (V-TFTs) with an InSnO-stabilized ZnO channel were fabricated. The vertical architecture enables devices with submicron channel lengths (≤500 nm) to afford delivering drain current greatly exceeding that of conventional ...
Xue-Mei Yin   +4 more
doaj   +1 more source

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