Results 71 to 80 of about 941 (185)

Development of 3D-Packaging Process Technology for Stacked Memory Chips

open access: yes, 2006
A 3D packaging technology for 4 Gbit DRAM has been developed. It is targeting to realize 4Gb density DRAM by stacking 8-DRAM chips into one package.
Osamu Kato   +14 more
core   +1 more source

Simultaneous Many-Row Activation in Off-The Dram Chips: Experimental Characterization and Analysis

open access: yes
King Abdullah University of Science and Technology; Resilient Computing and Cybersecurity Center54th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2024 -- 24 June 2024 through 27 June 2024 -- Brisbane -- 202203We ...
Oliveira, G.F.   +6 more
core   +1 more source

Architectural Techniques to Enhance DRAM Scaling

open access: yes, 2018
For decades, main memory has enjoyed the continuous scaling of its physical substrate: DRAM (Dynamic Random Access Memory). But now, DRAM scaling has reached a threshold where DRAM cells cannot be made smaller without jeopardizing their robustness.
Yoongu Kim (2269069)
core   +1 more source

ChargeCache: Reducing DRAM Latency by Exploiting Row Access Locality [PDF]

open access: yes, 2016
DRAM latency continues to be a critical bottleneck for system performance. In this work, we develop a low-cost mechanism,called ChargeCache, that enables faster access to recently accessed rows in DRAM, with no modifications to DRAM chips.
Donghyuk Lee   +13 more
core   +1 more source

Uncovering In-DRAM RowHammer Protection Mechanisms: A New Methodology, Custom RowHammer Patterns, and Implications

open access: yes, 2022
The RowHammer vulnerability in DRAM is a critical threat to system security. To protect against RowHammer, vendors commit to security-through-obscurity: modern DRAM chips rely on undocumented, proprietary, on-die mitigations, commonly known as Target Row
van der Veen, Victor   +5 more
core  

Concurrent Autonomous Self-Test for Uncore Components in System-on-Chips

open access: yes, 2018
Concurrent autonomous self-test, or online self-test, allows a system to test itself, concurrently during normal operation, with no system downtime visible to the end-user. Online self-test is important for overcoming major reliability challenges such as
Yanjing Li (5357837)   +3 more
core   +1 more source

DRAM-level prefetching for fully-buffered DIMM: Design, performance and power saving

open access: yes, 2007
We have studied DRAM-level prefetching for the fully buffered DIMM (FB-DIMM) designed for multi-core proces-sors. FB-DIMM has a unique two-level interconnect structure, with FB-DIMM channels at the first-level connecting the mem-ory controller and ...
Hongzhong Zheng   +4 more
core   +1 more source

Retrospective: RAIDR: Retention-Aware Intelligent DRAM Refresh

open access: yes, 2023
Dynamic Random Access Memory (DRAM) is the prevalent memory technology used to build main memory systems of almost all computers. A fundamental shortcoming of DRAM is the need to refresh memory cells to keep stored data intact.
Mutlu, Onur
core  

Retrospective: Flipping Bits in Memory Without Accessing Them: An Experimental Study of DRAM Disturbance Errors

open access: yes, 2023
Our ISCA 2014 paper provided the first scientific and detailed characterization, analysis, and real-system demonstration of what is now popularly known as the RowHammer phenomenon (or vulnerability) in modern commodity DRAM chips, which are used as main ...
Mutlu, Onur
core  

Understanding Reduced-Voltage Operation in Modern DRAM Devices

open access: yes, 2017
The energy consumption of DRAM is a critical concern in modern computing systems. Improvements in manufacturing process technology have allowed DRAM vendors to lower the DRAM supply voltage conservatively, which reduces some of the DRAM energy ...
Aditya Agrawal   +9 more
core   +1 more source

Home - About - Disclaimer - Privacy