Results 21 to 30 of about 767,342 (211)

Mathematical method for air electrostatic discharge circuits calculation

open access: yesHigh Voltage, 2018
Here, a new analytical method, state matrix transform method, is proposed for calculating the descriptions of current waveforms generated by commercial electrostatic discharge (ESD) generators.
Liu Xinggang, Wei Ming, Hu Xiaofeng
doaj   +1 more source

A Study of Transient Voltage Peaking in Diode-Based ESD Protection Structures in 28nm CMOS

open access: yesIEEE Access, 2020
Transient voltage peaking under very fast electrostatic discharge (ESD), like charged device model (CDM) pulse, is a serious problem to integrated circuits (ICs).
Chenkun Wang   +5 more
doaj   +1 more source

ESD risk evaluation of automatic semiconductor process equipment-a new guideline of the german ESD Forum e.V.

open access: yes, 2022
Art. 6333308While existing standards and guidelines mainly deal with standard requirements for EPAs and ESD-protected workplaces, only few recommendations exist for machines.
Gieser, H.   +7 more
core   +1 more source

Malfunctions of Medical Devices Due to Electrostatic Occurrences Big Data Analysis of 10 Years of the FDA’s Reports

open access: yesIEEE Access, 2018
An electrostatic discharge (ESD) event can cause a medical device to fail and pose a threat to patients'safety. This paper presents the data mining analysis of ESD failures in medical devices, over the last ten years, using the U.S.
Mehdi Kohani, Michael Pecht
doaj   +1 more source

Design of LDO Regulator With High Reliability ESD Protection Circuit Using Analog Current Switch Structure for 5-V Applications

open access: yesIEEE Access, 2023
The modern electronic device should be able to provide stable voltage and current under a variety of conditions. The LDO regulator used in the electronic device is a system that requires various voltages and load currents.
Sang-Wook Kwon, Yong-Seo Koo
doaj   +1 more source

System Level ESD Testing with Capacitively Coupled Stress Pulses

open access: yes, 2022
2026A debugging test method is presented which helps to identify susceptible pins which failed after system level ESD testing in compliance with IEC 61000-4-2.
Gieser, Horst   +3 more
core   +1 more source

Fabrication and performance of a nickel-chromium (NiCr) igniter integrated with TVS diode for ESD protection

open access: yesAIP Advances, 2023
The NiCr igniter is a key element of MEMS-based electro-explosive device (mEED), while electrostatic discharge (ESD) may excite the igniter accidentally. To protect the NiCr igniter from damage by ESD, a novel NiCr igniter by integrating the igniter onto
Wei Liu   +7 more
doaj   +1 more source

A compact broadband ESD protection circuit using multi‐layer helical inductor

open access: yesElectronics Letters, 2021
Here, a broadband electrostatic discharge (ESD) protection circuit using area‐efficient multi‐layer helical inductors is presented. The proposed concept was verified in a 0.18 μm 1P6M CMOS process, and the circuit area is only 54 × 63 μm2.
Wang‐Hui Zou, Peng Tang, Zhi‐Hua Zhu
doaj   +1 more source

Using CC-TLP to get a CDM robustness value

open access: yes, 2022
S.205-214Charged Device Model (CDM) like stress represents the highest ESD risk during handling of single devices. Today air discharge compromises repeatability of CDM tests of products in a package.
Gieser, H.   +5 more
core   +1 more source

Home - About - Disclaimer - Privacy