Results 41 to 50 of about 767,342 (211)

Improving ESD Protection Robustness Using SiGe Source/Drain Regions in Tunnel FET

open access: yesMicromachines, 2018
Currently, a tunnel field-effect transistor (TFET) is being considered as a suitable electrostatic discharge (ESD) protection device in advanced technology.
Zhaonian Yang   +3 more
doaj   +1 more source

Research progress on flexible MXene‐based materials in advanced energy storage devices: From preparation strategies to device applications

open access: yesFlexMat, EarlyView.
This review summarizes MXene synthesis and flexible electrode fabrication for FESDs, highlighting their potential owing to high conductivity and flexibility, and outlines future research directions. Abstract The rapid development of wearable and portable electronics has created demand for flexible energy storage systems (FESDs) that not only exhibit ...
Nanxi Miao   +10 more
wiley   +1 more source

How to detect Electrostatic discharge (ESD) using proximity probes on rotating machines [PDF]

open access: yes, 2020
Case StudyIn this session, a brief introduction about electrostatic discharge phenomena will be done. Then three historical cases with Electrostatic Discharge (ESD) issue will be analyzed in order to explain how to detect Electrostatic Discharge using ...
Christin, Guillaume, Peton, Nicolas
core   +1 more source

Deep sub-micron ESD GGNMOS layout design and optimization

open access: yesMATEC Web of Conferences, 2018
In the field of integrated circuits, ESD (Electro Static Discharge) has always been a rather serious problem of reliability. Enhanced ESD tolerance of IC chips became a focus of research on IC failure protection design.
Jun Shi
doaj   +1 more source

Recent Advances in Conductive Rubber Composites: Progress, Challenges, and Emerging Opportunities

open access: yesMacromolecular Rapid Communications, EarlyView.
This study reviews the recent advances in conductive rubber composites, focusing on key aspects such as material selection, conductive mechanisms, interfacial engineering, processing methods, vulcanization strategies, and practical applications. It also discusses current challenges and highlights emerging directions that are shaping the development of ...
Lu Yin   +3 more
wiley   +1 more source

ESD Protection Design: Fundamentals and Advanced Strategies

open access: yesIEEE Open Journal of the Solid-State Circuits Society
Electrostatic discharge (ESD) remains a critical reliability issue in CMOS technologies. This article reviews the fundamentals of ESD phenomena and introduces representative on-chip protection structures.
Chun-Yu Lin, Ming-Dou Ker
doaj   +1 more source

Characteristics of electrostatic discharges between metallic objects in the ion-flow field under HVDC lines

open access: yesThe Journal of Engineering, 2019
Metallic objects under high-voltage direct current (HVDC) transmission lines will produce certain induced voltages due to the charging of ion flow. Electrostatic discharge (ESD) may occur between two objects at different potentials when they are close ...
Xueshan Li, Donglai Wang, Tiebing Lu
doaj   +1 more source

Human body model electrostatic discharge tester using metal oxide semiconductor controlled thyristors

open access: yesETRI Journal, 2023
Electrostatic discharge (ESD) testing for human body model tests is an essential part of the reliability evaluation of electronic/electrical devices and components.
Dong Yun Jung   +7 more
doaj   +1 more source

Multiscale PA6 Composites Reinforced With Recycled Carbon Fibers and Graphene: Synergistic Effects on Mechanical and Electromagnetic Behavior

open access: yesPolymer Composites, EarlyView.
Synergistic effects of recycled carbon fibers and GNP on the mechanical and electromagnetic performance of multiscale PA6 composites. ABSTRACT The mechanical recycling of carbon fiber‐reinforced thermoplastics (CFRTs) generally degrades the mechanical properties of the resulting composites, primarily due to fiber length reduction. To partially overcome
Erick Gabriel Ribeiro dos Anjos   +5 more
wiley   +1 more source

Evolution, Revolution, and Technology Scaling—The Impact on ESD and EOS Reliability

open access: yesFrontiers in Materials, 2018
In the scaling of semiconductor devices, evolutionary and revolutionary modifications are made in the device dimension, structural changes, and dimensions.
Steven H. Voldman
doaj   +1 more source

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