Results 11 to 20 of about 609 (176)
The roll-to-roll (RtR) Manufacturing can produce a large amount of electrostatic charges. In terms of industrial safety, a large amount of energy can be released via electrostatic discharge (ESD) that can cause severe shocks, which can be a risk to ...
Khomsan Ruangwong +2 more
doaj +1 more source
Optimization of Tunnel Field-Effect Transistor-Based ESD Protection Network
The tunnel field-effect transistor (TFET) is a potential candidate for replacing the reverse diode and providing a secondary path in a whole-chip electrostatic discharge (ESD) protection network.
Zhihua Zhu +5 more
doaj +1 more source
Non-Pad-Based in Situ In-Operando CDM ESD Protection Using Internally Distributed Network
Charged device model (CDM) electrostatic discharge (ESD) protection is an emerging design challenge to ICs at advanced technology nodes. It was recently reported that the traditional pad-based CDM ESD protection methods are fundamentally faulty, which ...
Mengfu Di +3 more
doaj +1 more source
3D TCAD Analysis Enabling ESD Layout Design Optimization
On-chip electrostatic discharge (ESD) protection design for integrated circuits (ICs) is a challenging design-for-reliability problem. Since ESD events involve very high current transients in very short time period, current crowding is unavoidable, which
Zijin Pan +4 more
doaj +1 more source
ESD Design Verification Aided by Mixed-Mode Multiple-Stimuli ESD Simulation
Electrostatic discharge (ESD) protection is a grand design challenge for complex ICs in advanced technologies. ESD simulation is indispensable to guide ESD protection designs.
Mengfu Di +3 more
doaj +1 more source
Investigation of the effect of polyaniline additive on reducing static charge accumulation in HMX and PETN explosives [PDF]
One of the main causes of explosions events in high energetic material industry is static electricity. Handling of energetic materials leads to the generation of electrostatic charges. Most energetic materials are non-conductive, easily accumulate charge
Manoochehr Fathollahi +4 more
doaj +1 more source
Electrostatic Discharge (ESD), Electrical Overstress (EOS) and electromagnetic compatibility (EMC) continue to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics.
Steven H. Voldman
doaj +1 more source
Pad-Based CDM ESD Protection Methods Are Faulty
Charged device model (CDM) electrostatic discharge (ESD) protection remains a huge challenge for integrated circuit (IC) reliability designs. The “internal-oriented” CDM model and the “external-oriented” human body model (HBM)
Mengfu Di +3 more
doaj +1 more source
The power-rail electrostatic discharge (ESD) clamp circuits have been widely used in CMOS integrated circuits (ICs) to provide effective discharging paths for on-chip ESD protection design. Among all ESD events, the most serious threat is posed to ICs by
Yi-Chun Huang, Ming-Dou Ker
doaj +1 more source
The Dynamic Energy Band Model of Contact-Separation and Sliding Mode Triboelectric Charging of Polymers at the Metal-Polymer Interface. [PDF]
Triboelectric charge generation at polymer‐metal interfaces arises from the interplay of polymer mechanochemistry, polymer physical properties, and material transfer, where ion‐derived dipoles modulate the interfacial potential and mechanochemically generated electronic states and work function differences drive electron transfer, providing a unified ...
Ekim SD +4 more
europepmc +2 more sources

