Results 11 to 20 of about 767,342 (211)
Secondary discharge - a potential risk during system level ESD testing
, 2022 S.99-105By means of a floating handheld electronic product this work describes the influence of secondary discharge events during system level ESD testing on the failure threshold of the involved electronic circuit. In order to increase the robustness it
Gieser, H., Wolf, H.
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Non-Pad-Based in Situ In-Operando CDM ESD Protection Using Internally Distributed Network
IEEE Journal of the Electron Devices Society, 2021 Charged device model (CDM) electrostatic discharge (ESD) protection is an emerging design challenge to ICs at advanced technology nodes. It was recently reported that the traditional pad-based CDM ESD protection methods are fundamentally faulty, which ...
Mengfu Di +3 more
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3D TCAD Analysis Enabling ESD Layout Design Optimization
IEEE Journal of the Electron Devices Society, 2020 On-chip electrostatic discharge (ESD) protection design for integrated circuits (ICs) is a challenging design-for-reliability problem. Since ESD events involve very high current transients in very short time period, current crowding is unavoidable, which
Zijin Pan +4 more
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Self-ESD-protected transmission line broadband in CMOS28nm UTBB-FDSOI
, 2022 S.57-63Advanced CMOS Technologies, and particularly Ultra-Thin Body and BOX Fully Depleted Silicon on Insulator (UTBB-FDSOI) technology provide good performances for analog high frequency and ultra-low power applications.
Heitz, B. +4 more
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ESD Design Verification Aided by Mixed-Mode Multiple-Stimuli ESD Simulation
IEEE Journal of the Electron Devices Society, 2021 Electrostatic discharge (ESD) protection is a grand design challenge for complex ICs in advanced technologies. ESD simulation is indispensable to guide ESD protection designs.
Mengfu Di +3 more
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Engineering and Applied Science Research, 2017 Electrostatic Discharge (ESD), Electrical Overstress (EOS) and electromagnetic compatibility (EMC) continue to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics.
Steven H. Voldman
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Investigation of the effect of polyaniline additive on reducing static charge accumulation in HMX and PETN explosives [PDF]
شیمی کاربردی روز, 2022 One of the main causes of explosions events in high energetic material industry is static electricity. Handling of energetic materials leads to the generation of electrostatic charges. Most energetic materials are non-conductive, easily accumulate charge
Manoochehr Fathollahi +4 more
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Pad-Based CDM ESD Protection Methods Are Faulty
IEEE Journal of the Electron Devices Society, 2020 Charged device model (CDM) electrostatic discharge (ESD) protection remains a huge challenge for integrated circuit (IC) reliability designs. The “internal-oriented” CDM model and the “external-oriented” human body model (HBM)
Mengfu Di +3 more
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IEEE Journal of the Electron Devices Society, 2023 The power-rail electrostatic discharge (ESD) clamp circuits have been widely used in CMOS integrated circuits (ICs) to provide effective discharging paths for on-chip ESD protection design. Among all ESD events, the most serious threat is posed to ICs by
Yi-Chun Huang, Ming-Dou Ker
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A study of electrostatically sprayed CuInS2 and ZnS thin films [PDF]
, 2009 The investigation of ternary compounds for the fabrication of thin film solar cells is well documented but the production of thin films by electrostatic spray deposition (ESD) is still limited.
Roncallo, Scilla
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