Results 11 to 20 of about 619 (178)
Non-Pad-Based in Situ In-Operando CDM ESD Protection Using Internally Distributed Network
IEEE Journal of the Electron Devices Society, 2021 Charged device model (CDM) electrostatic discharge (ESD) protection is an emerging design challenge to ICs at advanced technology nodes. It was recently reported that the traditional pad-based CDM ESD protection methods are fundamentally faulty, which ...
Mengfu Di +3 more
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3D TCAD Analysis Enabling ESD Layout Design Optimization
IEEE Journal of the Electron Devices Society, 2020 On-chip electrostatic discharge (ESD) protection design for integrated circuits (ICs) is a challenging design-for-reliability problem. Since ESD events involve very high current transients in very short time period, current crowding is unavoidable, which
Zijin Pan +4 more
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ESD Design Verification Aided by Mixed-Mode Multiple-Stimuli ESD Simulation
IEEE Journal of the Electron Devices Society, 2021 Electrostatic discharge (ESD) protection is a grand design challenge for complex ICs in advanced technologies. ESD simulation is indispensable to guide ESD protection designs.
Mengfu Di +3 more
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Engineering and Applied Science Research, 2017 Electrostatic Discharge (ESD), Electrical Overstress (EOS) and electromagnetic compatibility (EMC) continue to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics.
Steven H. Voldman
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IEEE Journal of the Electron Devices Society, 2023 The power-rail electrostatic discharge (ESD) clamp circuits have been widely used in CMOS integrated circuits (ICs) to provide effective discharging paths for on-chip ESD protection design. Among all ESD events, the most serious threat is posed to ICs by
Yi-Chun Huang, Ming-Dou Ker
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Investigation of the effect of polyaniline additive on reducing static charge accumulation in HMX and PETN explosives [PDF]
شیمی کاربردی روز, 2022 One of the main causes of explosions events in high energetic material industry is static electricity. Handling of energetic materials leads to the generation of electrostatic charges. Most energetic materials are non-conductive, easily accumulate charge
Manoochehr Fathollahi +4 more
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Pad-Based CDM ESD Protection Methods Are Faulty
IEEE Journal of the Electron Devices Society, 2020 Charged device model (CDM) electrostatic discharge (ESD) protection remains a huge challenge for integrated circuit (IC) reliability designs. The “internal-oriented” CDM model and the “external-oriented” human body model (HBM)
Mengfu Di +3 more
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Mathematical method for air electrostatic discharge circuits calculation
High Voltage, 2018 Here, a new analytical method, state matrix transform method, is proposed for calculating the descriptions of current waveforms generated by commercial electrostatic discharge (ESD) generators.
Liu Xinggang, Wei Ming, Hu Xiaofeng
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A novel SPICE circuit model of electrostatic discharge (ESD) generator
IEICE Electronics Express, 2016 Yuan Wang, Guangyi Lu
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A Study of Transient Voltage Peaking in Diode-Based ESD Protection Structures in 28nm CMOS
IEEE Access, 2020 Transient voltage peaking under very fast electrostatic discharge (ESD), like charged device model (CDM) pulse, is a serious problem to integrated circuits (ICs).
Chenkun Wang +5 more
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