Results 81 to 90 of about 767,342 (211)
Robust Electrostatic Discharge (Esd) Protection For Microchips
Silicon controlled rectifiers (SCRs) are frequently used to build on-chip electrostatic discharge (ESD) structures, but SCRs are not sufficiently robust to meet a wide range of ESD requirements in various integrated circuits.
Liou, J. J. +2 more
core
Study Of Electrostatic Discharge (ESD) Signals In Integrated Circuits
This thesis highlights the work done to investigate selected electromagnetic (EM) wave properties related to Electrostatic Discharge (ESD). It is known that ESD events generate EM waves, and numerous authors have investigated many properties related to ...
Choo, Wei Chien
core +1 more source
Protective equipment represents an alternative for the sustainable development of companies and for human health protection. The insertion of "invisible functionalities" in textile structures, the use of functional elements as part of the whole garment ...
SCARLAT Răzvan +5 more
doaj
KSC Electrostatic Discharge (ESD) Issues [PDF]
Discussion of key electrostatic issues that have arisen during the past few years at KSC that the Electrostatics Laboratory has studied. The lab has studied in depth the Space Shuttle's Thermal Control System Blankets, the International Space Station ...
Buhler, Charles
core
Investigating ESD sensitivity in electrostatic SiGe MEMS
The sensitivity of electrostatically actuated SiGe microelectromechanical systems to electrostatic discharge events has been investigated in this paper.
Thijs, Steven +6 more
core +1 more source
Electrostatic discharge as a breakthrough strategy for triboelectric nanogenerators
As the Internet of Things (IoT) has expanded, the global energy problem has increased the demand for high-performance self-powered sensors; however, traditional triboelectric nanogenerators (TENGs) are limited by low current outputs and pulsed AC signals.
Seh-Hoon Chung +2 more
doaj +1 more source
Secondary Discharge during System Level ESD Tests
S.147-153By means of two examples, this work describes the influence of secondary discharge events during system level ESD testing on the failure threshold and the failure behavior of the involved electronic circuits. The first system is a kind of remote
Gieser, Horst +2 more
core +1 more source
Thyristor compact model for ESD, DC and RF simulation
A Spice Gummel-Poon based thyristor compact model is developed. It is integrating ESD, DC and RF circuit simulation capability in one model. The paper shows a simplified parameter extraction flow for a dynamically triggered thyristor.
Soldner W. +4 more
core +1 more source
Gateoxidzuverlässigkeit nach ESD-Belastung
Die bei CMOS-Bauelementen bekannten oder vermuteten Arten von ESD-Schäden, die sich im Betrieb als Zuverlässigkeitsproblem äussern könnten, hängen mit der Schädigung des Gateoxides zusammen.
Reiner, Joachim C. (author)
core +1 more source
Multi-peaked analytically extended function representing electrostatic discharge (ESD) currents
A multi-peaked analytically extended function (AEF), previously applied by the authors to modeling of lightning dischargecurrents, is used in this paper for representation of the electrostatic discharge (ESD) currents.
Sergei Silvestrov +7 more
core +1 more source

