Results 71 to 80 of about 767,342 (211)

Real-Time ESD Monitoring and Control in Semiconductor Manufacturing Environments With Silicon Chip of ESD Event Detection

IEEE Journal of the Electron Devices Society
Integrated circuits are susceptible to electrostatic discharge (ESD) events. Real-time detection and alerting of ESD events in semiconductor manufacturing environments is the key to achieving well ESD control.
Chang-Jiun Lai, Ming-Dou Ker
doaj   +1 more source

TCAD Simulation Study of ESD Behavior of InGaAs/InP Heterojunction Tunnel FETs

Crystals, 2020
For the first time, we investigated the electrostatic discharge (ESD) behavior of an InGaAs/InP heterojunction tunneling field effect transistor (HTFET). The device structure in this study has a high on-state current without extra process steps.
Zhihua Zhu, Zhaonian Yang, Yingtao Zhang, Xiaomei Fan, Juin Jei Liou, Wenbing Fan   +5 more
doaj   +1 more source

Prediction of Properties of Polymer Composite Formulations Using Ensemble Models With Feature Generation

Journal of Applied Polymer Science, Volume 143, Issue 25, July 5, 2026.
This study develops an interpretable machine‐learning framework to predict multiple properties of polymer composites based on composition and processing variables. By combining ensemble models with composition‐based feature generation and SHAP‐based interpretation, the approach reveals composition‐property relationships and supports efficient multi ...
Dong Ryeol Shin, Sung Kwang Lee
wiley   +1 more source

Discharge Currents of Metallized Silicon Chiplets at Low Pre-Charge Voltages

This paper presents a new current sensor, which incorporates two microstrip lines: one designed for charging the device under test (DUT) and the other facilitating precise discharges into a 33 GHz oscilloscope.
Heiland, Leon, Merkel, Ellen, Wolf, Heinrich   +2 more
core   +1 more source

Electro Static Discharge Testing on Meteosat 3rd Generation Photovoltaic Assembly

E3S Web of Conferences, 2017
The electrostatic discharge testing on Photovoltaic Assemblies has been thoroughly investigated and performed during the last decade to ensure durability of solar arrays, especially in cases of high power satellites.
Damonte Giulia, Saltanocchi Giorgio, Zanella Pietro, Ferrando Emanuele, Riva Stefano, Meniconi Gianfranco, Pagano Damiano, Scortecci Fabrizio   +7 more
doaj   +1 more source

Thermal Degradation and Thermal Decomposition of Plasticized PVC Including POSS Additives for PVC Compounds: Mechanisms, Impact, and Performance of Standards

Journal of Vinyl and Additive Technology, Volume 32, Issue 4, Page 1049-1077, July 2026.
Additives' structures. ABSTRACT Poly(vinyl chloride) has been a key polymeric material since its commercial production in 1931, demonstrating versatility across numerous industries due to its compatibility with various additives. PVC's inherent properties, flame retardance, durability, and recyclability make it ideal for building and construction ...
Stefano Gardi, Gianluca Sarti, Luca Palin, Enrico Boccaleri, Alberto Frache   +4 more
wiley   +1 more source

Electrostatic discharge and electrical overstress on GaN/InGaN Light Emitting Diodes

, 2001
Results of ESD testing (HBM and TLP) carried out on commercially available GaN LEDs grown on sapphire or silicon carbide will be presented. A non optimal design of layout leads to current crowding phenomena determining premature failure. Devices grown on
ZANONI, ENRICO, Meneghesso, G., Zanoni, E., CIAPPA M., MENEGHESSO, GAUDENZIO, MALBERTI P., Ciappa, M., Maschietto, A., CHINI, ALESSANDRO, MASCHIETTO A., Malberti, P.   +10 more
core  

ESD Internal Conference Extended Abstracts [PDF]

, 2002
This working paper contains the extended abstracts received to date for the ESD Colloquium to be held on May 29 and 30, 2002.
ESD Colloquium Committee
core  

Neue Messmethode zur ESD Risikoabschätzung in Bestückungsanlagen

, 2019
ESD Risiko evaluationen an Bestückungsautomaten sind in den letzten Jahren schwieriger geworden. Hohe Prozessgeschwindigkeiten und erschwerte Zugänglichkeit an den kritischen Messstellen verunmöglichten zusehends direkte Messungen.
Jacob, Peter (author)
core   +1 more source

Novel electrostatic discharge (ESD) protection solution in GaAs pHEMT technology

, 2012
This paper develops an effective electrostatic discharge (ESD) protection solution for GaAs-based integrated circuits based on a novel multi-gate pHEMT.
Juin J. Liou, Qiang Cui, Cui, Qiang, Liou, Juin J.   +3 more
core   +1 more source