Results 71 to 80 of about 609 (176)

Temperature dependence of ESD effects on 28 nm FD‐SOI MOSFETs

open access: yesEngineering Reports
The failure mechanisms caused by electrostatic discharge (ESD) effects at ambient temperatures ranging from −75 to 125°C are investigated by Silvaco TCAD simulator.
Yiping Xiao   +6 more
doaj   +1 more source

Assessment of electrostatic discharge sensitivity of nitrogen-rich heterocyclic energetic compounds and their salts as high energy-density dangerous compounds: A study of structural variables

open access: yesDefence Technology
Nitrogen-rich heterocyclic energetic compounds (NRHECs) and their salts have witnessed widespread synthesis in recent years. The substantial energy-density content within these compounds can lead to potentially dangerous explosive reactions when ...
Mohammad Hossein Keshavarz   +3 more
doaj   +1 more source

Charge Characteristics of Dielectric Particle Swarm Involving Comprehensive Electrostatic Information. [PDF]

open access: yesMicromachines (Basel), 2023
Feng Y   +6 more
europepmc   +1 more source

A False Trigger-Strengthened and Area-Saving Power-Rail Clamp Circuit with High ESD Performance. [PDF]

open access: yesMicromachines (Basel), 2023
Ma B   +7 more
europepmc   +1 more source

Improved rehydration characteristic of micellar casein powder by electrostatic spray drying. [PDF]

open access: yesFood Chem X
Wang K   +11 more
europepmc   +1 more source

Reversible dielectric polymers with switchable conduction and insulation for electrostatic protection. [PDF]

open access: yesNat Commun
Xu H   +16 more
europepmc   +1 more source

Home - About - Disclaimer - Privacy