Results 171 to 180 of about 15,744,307 (196)

A Compact Model of Ferroelectric Field-Effect Transistor [PDF]

open access: yesIEEE Electron Device Letters, 2022
In this letter, we present a compact model of ferroelectric field-effect-transistor (FEFET). The model consists of a ferroelectric (FE) capacitor model and a Berkeley Short-channel IGFET Model (BSIM), a standard SPICE MOSFET model.
Sayeef Salahuddin   +2 more
exaly   +2 more sources
Some of the next articles are maybe not open access.

Related searches:

Demonstration of bias scheme for ferroelectric field-effect transistor (FeFET) based AND array operation

Solid-State Electronics
Shinhee Kim   +6 more
openaire   +3 more sources

Novel Ferroelectric Gate Field-Effect Transistors (FeFETs); Controlled Polarization-Type FeFETs

2020
Controlled-polarization-type ferroelectric-gate thin film transistors (FeTFTs), which utilize the interaction between the polarizations of a polar semiconductor and a ferroelectric layer, have been proposed. When the polarizations align head-to-head, electrons that correspond to the sum of the polarizations are induced at the interface between the ...
Norifumi Fujimura, Takeshi Yoshimura
openaire   +1 more source

Ferroelectric Field Effect Transistors (FeFETs): Advancements, challenges and exciting prospects for next generation Non-Volatile Memory (NVM) applications

Materials Today Communications, 2023
J. Ajayan   +9 more
openaire   +1 more source

A simulation study about the memory operation of 3D-stacked capacitor-less 1T DRAM cells based on ferroelectric field-effect transistors (FeFETs)

2023 20th International SoC Design Conference (ISOCC), 2023
Taegun Kim   +3 more
openaire   +1 more source

Sub-Nanosecond Switching of Si:HfO2 Ferroelectric Field-Effect Transistor

Nano Letters, 2023
Eilam Yalon   +2 more
exaly  

Reliability Optimization in Hafnium Oxide Based Ferroelectric Field-Effect Transistors (FeFETs)

2025 9th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
Kechao Tang   +3 more
openaire   +1 more source

Wakeup-Free and Endurance-Robust Ferroelectric Field-Effect Transistor Memory Using High Pressure Annealing

IEEE Electron Device Letters, 2021
Dae Woong   +2 more
exaly  

Home - About - Disclaimer - Privacy