Results 61 to 70 of about 223 (167)

Analysis and Design of a 2-40.5 GHz Low Noise Amplifier With Multiple Bandwidth Expansion Techniques

open access: yesIEEE Access, 2023
This paper analyzes the main factors limiting the bandwidth expansion of low-noise amplifiers (LNA) and designs a broadband LNA with a bandwidth of 2-40.5 GHz.
Jiaxuan Li   +6 more
doaj   +1 more source

A compact 60‐GHz on‐chip bandpass filter in GaAs technology

open access: yesElectronics Letters, Volume 60, Issue 7, April 2024.
A compact 60‐GHz on‐chip bandpass filter (BPF) is presented using gallium arsenide (GaAs) technology. The measurements show that it has a centre frequency of 60.2 GHz with a bandwidth of 14%, and the minimum insertion loss (IL) within the passband is 2.57 dB. The chip size, excluding the feedings, is about 0.265 mm × 0.184 mm. Abstract A compact 60‐GHz
Kai‐Da Xu   +3 more
wiley   +1 more source

Study of DX centers in AlGaAs/InGaAs/GaAs pHEMT

open access: yesИзвестия высших учебных заведений России: Радиоэлектроника
Introduction. A major challenge in AlGaAs-based heterostructure devices is the presence of DX centers in heavily doped n-type layers. These deep donor traps degrade the performance of pseudomorphic high electron mobility transistors (pHEMTs).
A. V. Sapozhnikov   +4 more
doaj   +1 more source

The MMIC design of GaAs bi-phase voltage variable attenuator

open access: yesDianzi Jishu Yingyong, 2019
A 13~16 GHz bi-phase voltage variable attenuator(VVA) based on 0.25 μm gallium arsenide pseudomorphic high electron mobility transistors(GaAs pHEMT) process is presented.
Yuan Yifei, Zhang Bo
doaj   +1 more source

A comprehensive packaging solution from DC to 113 GHz for InGaAs amplifiers

open access: yesElectronics Letters, Volume 60, Issue 6, March 2024.
This letter describes an ultra‐broadband amplifier package operating from DC to 113 GHz, boasting a 12.5 dB average gain. It employs InGaAs amplifier IC in metamorphic high‐electron‐mobility‐transistor technology, mounted on an aluminum submount for low thermal resistance, with 1 mm connectors for ease of use.
Luca Valenziano   +6 more
wiley   +1 more source

Thermal Characteristic Investigation for a Multichip Module Based on APDL

open access: yesInternational Journal of RF and Microwave Computer-Aided Engineering, Volume 2024, Issue 1, 2024.
Aiming at the failure problems of integrated circuit (IC) caused by higher package density, thinner package, and more heat sources, taking a multichip module (MCM) for receiver front end as an example, the 3‐D model is established based on ANSYS Parametric Design Language (APDL).
Qian Lin   +4 more
wiley   +1 more source

High-speed pHEMT-based low noise amplifier for 2.4-GHz wireless communication

open access: yesJournal of Electronic Science and Technology
In the era of rapidly expanding wireless technologies, the push for larger spectrum efficiency and better signal integrity has intensified the need for high-efficient and low noise amplifiers (LNAs). A two-stage LNA based on the GaAs/InGaAs pseudomorphic
Omar S. Abdulwahid   +4 more
doaj   +1 more source

Electrical degradation mechanisms of RF power GaAs PHEMTs [PDF]

open access: yesIEEE International Electron Devices Meeting 2003, 2004
In this research, we have carried out a systematic investigation of the electrical degradation of RF power PHEMTs. By examining devices with different geometries as well as a variety of test structures, our research confirms previous observations of degradation under the gate of the device.
A.A. Villanueva   +3 more
openaire   +1 more source

A Gold Free Aluminum Metalized GaAs PHEMT With Copper Based Air Bridges and Backside

open access: yesIEEE Journal of the Electron Devices Society, 2013
This paper presents the results of electrical performance studies of the newly developed GaAs pHEMT transistors with Al-based metallization of the ohmic and barrier contacts, and fully copper metallization of interconnects, air bridges, and backside. The
Evgeny V. Erofeev   +5 more
doaj   +1 more source

High-breakdown AlGaAs/InGaAs/GaAs PHEMT with telluriumdoping

open access: yesElectronics Letters, 1995
The authors report the fabrication and characterisation of an Al/sub 0.43/Ga/sub 0.57/As/In/sub 0.2/Ga/sub 0.8/As/GaAs pseudomorphic HEMT (PHEMT) with high channel conductivity grown by solid source MBE. The high conductivity of the channel is a direct consequence of the high sheet charge and high mobility that has recently been obtained by using ...
N.X. Nguyen   +3 more
openaire   +1 more source

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