Results 151 to 160 of about 1,279 (182)

Comparative Study of Silicon and In0.53Ga0.47As-Based Gate-All-Around (GAA) MOSFETs

2021
Himanshi Awasthi, Nitish Kumar, Vaibhav Purwar, Abhinav Gupta, Vikrant Varshney, Sanjeev Rai   +5 more
openaire   +1 more source

Fin Aspect Ratio Optimization of Novel Junctionless Gate Stack Gate All Around (GS-GAA) FinFET for Analog/RF Applications

Lecture Notes in Electrical Engineering, 2021
Rishu Chaujar, Bhavya Kumar
exaly  

Gate Electrode Work Function Engineered JAM-GS-GAA FinFET for Analog/RF Applications: Performance Estimation and Optimization

Microelectronics Journal, 2023
Rishu Chaujar, Mekonnen Getnet, Megha Sharma   +2 more
exaly  

TCAD Temperature Analysis of Gate Stack Gate All Around (GS-GAA) FinFET for Improved RF and Wireless Performance

Silicon, 2021
Rishu Chaujar, Bhavya Kumar
exaly  

A Novel Technique to Investigate the Impact of Temperature and Process Parameters on Electrostatic and Analog/RF Performance of Channel Modulated Junctionless Gate-All-Around (CM-JL-GAA) MOSFET

Silicon, 2022
Abhinav Gupta, Amit Kumar Pandey
exaly  

A Novel Approach to Investigate the Impact of Hetero-High-K Gate Stack on SiGe Junctionless Gate-All-Around (JL-GAA) MOSFET

Silicon, 2022
Abhinav Gupta, Nitish Kumar, Sanjeev Rai
exaly  

3nm Gate-All-Around (GAA) Design-Technology Co-Optimization (DTCO) for succeeding PPA by Technology

2022 IEEE Custom Integrated Circuits Conference (CICC), 2022
Taejoong Song, Hakchul Jung, Giyoung Yang, Hoyoung Tang, Hayoung Kim, Dongwook Seo, Hoonki Kim, Woojin Rim, Sanghoon Baek, Sangyeop Baeck, Jonghoon Jung   +10 more
openaire   +1 more source

Temperature Dependent Linearity/Harmonic Analysis for FinFET and Gate All Around (GAA) Nanowire FET

2021 IEEE 2nd International Conference on Applied Electromagnetics, Signal Processing, & Communication (AESPC), 2021
Rinku Rani Das, Atanu Chowdhury, Apurba Chakraborty   +2 more
openaire   +1 more source

Soft-Error Sensitivity in SRAM Manufactured by Bulk Gate-All-Around (GAA) Technology

2024 IEEE International Reliability Physics Symposium (IRPS)
Taiki Uemura, Byungjin Chung, Jaehee Choi, Seungbae Lee, Shin-Young Chung, Yuchul Hwang, Sangwoo Pae   +6 more
openaire   +2 more sources

A New T-Shaped Source/Drain Extension (T-SSDE) Gate Underlap GAA MOSFET With Enhanced Subthreshold Analog/RF Performance for Low Power Applications

Solid-State Electronics, 2014
Mridula Gupta, Subhasis Haldar, R S Gupta   +2 more
exaly