Performance investigation of 1T1R memory cell using GAA MBC-FET technology
The ultimate advancement beyond FinFET technology is the Gate-All-Around (GAA) Multi-Bridge-Channel FET (MBCFET) technology. GAA MBCFET features vertically stacked multiple channels, a departure from single-channel designs, thereby enhancing overall ...
Rinku Rani Das +2 more
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In the context of increasing digitalization and the emergence of applications such as smart cities, embedded devices are becoming ever more pervasive, mobile, and ubiquitous.
Ram Devi +5 more
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Performance Study and Analysis of Heterojunction Gate All Around Nanowire Tunneling Field Effect Transistor [PDF]
In this paper, we have presented a heterojunction gate all around nanowiretunneling field effect transistor (GAA NW TFET) and have explained its characteristicsin details.
Mahsa Roohy, Reza Hosseini
doaj
We introduce a compact model for characterizing the transient program operation of Gate-All-Around (GAA) Barrier-Engineered charge-trapping NAND flash (BE-CTNF) memory, especially in the FN-tunneling regime.
Haechan Choi, Hyungcheol Shin
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Impact of strain of sub-3 nm gate-all-around (GAA) CMOS transistors on the circuit performance is evaluated using a neural compact model. The model was trained using 3D technology computer-aided design (TCAD) device simulation data of GAA field-effect ...
Ji Hwan Lee +5 more
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3D Nanoscale Imaging of Semiconductor Films for GAA (Gate All Around) Device Development
Pritesh Parikh +2 more
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Analytical subthreshold swing model of junctionless elliptic gate-all-around (GAA) FET
<p>An analytical subthreshold swing (SS) model has been presented to determine the SS of an elliptic junctionless gate-all-around field-effect transistor (GAA FET). The analysis of a GAA FET with an elliptic cross-section is essential because it is difficult to manufacture a GAA FET with an accurate circular cross-section during the process.
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A Physics-Based Compact Model for P-Type Ballistic Nanowire GAA MOSFETs Incorporating the Source-to-Drain Tunneling Effect. [PDF]
Cheng H, Yang Z, Zhang C, Zhang Z.
europepmc +1 more source
Performance analysis of electrostatic and transport characteristics of underlap-engineered gate-all-around carbon nanotube (CNT) FETs for nanoelectronics circuitry applications. [PDF]
Bose SJ, Dhar RS, Hussein MI, Awwad F.
europepmc +1 more source
Channel-engineered GAA FETs: From device to circuit perspective for Angstrom technology nodes. [PDF]
Bharath Sreenivasulu V, Thoti N.
europepmc +1 more source

