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Self-Calibrating TSEP for Junction Temperature and RUL Prediction in GaN HEMTs. [PDF]

open access: yesNanomaterials (Basel)
Cui Y   +6 more
europepmc   +1 more source

Optimization of Low-Voltage p-GaN Gate HEMTs for High-Efficiency Secondary Power Conversion. [PDF]

open access: yesMicromachines (Basel)
Zhai L   +13 more
europepmc   +1 more source

On-Wafer Gate Screening Test for Improved Pre-Reliability in p-GaN HEMTs. [PDF]

open access: yesMicromachines (Basel)
Giorgino G   +13 more
europepmc   +1 more source
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ASM-HEMT: Compact model for GaN HEMTs

2015 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC), 2015
In this paper, we aim to present the Advances Spice Model for High Electron Mobility Transistors (ASM-HEMT). The model is currently being considered in the second phase of industry standardization by the Compact Model Coalition (CMC). The presented physical model is surface potential based and is computationally efficient by virtue of being completely ...
Avirup Dasgupta   +3 more
openaire   +1 more source

High-Temperature HEMT Model

IEEE Transactions on Electron Devices, 2022
Taking into account the impact of self-heating and temperature rise effects, this work presents a physics-based analytical model for HEMTs, operating continuously from room temperature to high temperatures in linear and saturation regimes. Relying on the core Ecole Polytechnique Federale de Lausanne (EPFL) HEMT model, the temperature dependence of ...
Nika Sahebghalam   +3 more
openaire   +1 more source

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