Results 101 to 110 of about 2,847 (219)

Modeling of high electron mobility transistors

open access: yesТехнологія та конструювання в електронній апаратурі, 2003
The paper considers issues of modeling high electron mobility transistors (HEMT). The requirements for HEMT models are outlined. The most common types of models are described: small-signal, noise, nonlinear, and distributed.
P. A. Emtsev
doaj  

Electromechanical Displacement Detection With an On-Chip High Electron Mobility Transistor Amplifier

open access: yes, 2011
We developed a highly sensitive displacement detection scheme for a GaAs-based electromechanical resonator using an integrated high electron mobility transistor (HEMT).
Reo Kometani   +5 more
core   +1 more source

A new preparation approach for high-resolution TEM analysis of electrically active defects in p-GaN HEMT devices from two orthogonal perspectives

open access: yesPower Electronic Devices and Components
The characterization of crystal defects inside GaN epi layers, especially dislocations, is of major interest to further improve the performance and reliability of GaN high-electron-mobility transistor (HEMT) devices. This work presents a new approach for
Patrick Diehle   +6 more
doaj   +1 more source

Influence of AlN interfacial layer on electrical properties of high-Al-content Al0.45Ga0.55N/GaN HEMT structure

open access: yes, 2006
Unintentionally doped high-Al-content Al0.45Ga0.55N/GaN high electron mobility transistor (HEMT) structures with and without AlN interfacial layer were grown by metal-organic chemical vapor deposition (MOCVD) on two-inch sapphire substrates.
Wang JX (Wang Junxi)   +6 more
core  

Modeling of AlGaN/GaN High Electron Mobility Transistor for Sensors and High-Temperature Circuit Applications

open access: yes, 2008
With the most advanced and mature technology for electronic devices, silicon (Si) based devices can be processed with practically no material defects.
Eliza, Sazia Afreen
core   +1 more source

High Electron Mobility Transistor Structures on Sapphire Substrates Using CMOS Compatible Processing Techniques

open access: yes, 2004
System-on-a-chip (SOC) processes are under intense development for high-speed, high frequency transceiver circuitry. As frequencies, data rates, and circuit complexity increases, the need for substrates that enable high-speed analog operation, low-power ...
Mueller, Carl   +3 more
core   +1 more source

Deep centers investigations of P-HEMT functional materials of ultra-high-speed microstructures grown by MBE

open access: yes, 2002
The deep centers of high electron mobility transistor (HEMT) and pseudomorphic-HEMT (P-HEMT) functional materials of ultra-high-speed microstructures grown by MBE are investigated using deep level transient spectroscopy (DLTS) technique.
Ge W   +4 more
core  

AlGaN/AlN/GaN/SiC HEMT structure with high mobility GaN thin layer as channel grown by MOCVD

open access: yes, 2007
Enhancement of the electrical properties in an AlGaN/GaN high electron mobility transistor (HEMT) structures was demonstrated by employing the combination of a high mobility GaN channel layer and an AlN interlayer. The structures were grown on 50 mm semi-
Li HP (Li Hanping)   +12 more
core  

Ultrahigh-Responsivity Ultraviolet Photodetectors Based on AlGaN/GaN Double-Channel High-Electron-Mobility Transistors

open access: yes
In this work, high-performance ultraviolet (UV) photodetectors (PDs) based on an AlGaN/GaN double-channel high-electron-mobility transistor (HEMT) were fabricated and investigated using 360 nm illumination.
Yaozong Zhong (17688516)   +7 more
core   +1 more source

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