Results 161 to 170 of about 2,847 (219)
Design of Dual Continuous-Mode Class-J Power Amplifiers with Harmonic Matching Networks for X and Ku Bands. [PDF]
Yuan Y, Zhao X, Fan J, Yu Z.
europepmc +1 more source
Using both faces of polar semiconductor wafers for functional devices. [PDF]
van Deurzen L +10 more
europepmc +1 more source
Two-dimensional buffer breaks substrate limit in III-nitrides epitaxy. [PDF]
Sang Y +18 more
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A Review of Ku-Band GaN HEMT Power Amplifiers Development. [PDF]
Kim J.
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Semiconductor lasers and high electron mobility transistors (HEMTs) using InP-related materials
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Electron transport properties of Al0.3Ga0.7 N/GaN high electron mobility transistor (HEMT)
In this study, a Al 0.3 Ga 0.7 N/GaN high electron mobility transistor (HEMT) structure is grown on a c-oriented sapphire substrate using a metal organic chemical vapor deposition (MOCVD) system. Resistivity (ρ), Hall mobility (μ) and carrier density (n) are measured in 0.01–0.14 T magnetic field range and 25–340 K temperature range.
Ahmet Kursat Bilgili +2 more
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Reliability based design optimization applied to the high electron mobility transistor (HEMT)
Microelectronics Reliability, 2021Abstract Among the most important components in complex and high-power mechatronic systems is the transistor. The High Electron Mobility Transistor (HEMT) is a technology under development. This paper presents the hybrid Reliability Based Design Optimization (RBDO) method applied to the HEMT technology in order to improve its performance and ...
Bouchaib Radi, Abdelkhalak El Hami
exaly +2 more sources
The early history of the high electron mobility transistor (HEMT)
IEEE Transactions on Microwave Theory and Techniques, 2002The early history of the high electron mobility transistor illustrates the way in which a new device idea occurs and is developed towards commercialization. The events which took place in our laboratory are described in this paper.
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An inserted novel polarization-graded AlGaN back barrier structure is designed to enhance performances of In0.17Al0.83N/GaN high electron mobility transistor (HEMT), which is investigated by the two-dimensional drift-diffusion simulations.
Jicong Zhao, Guofeng Yang, Gu Yan
exaly +2 more sources

