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e-HEMT : an engineering model for GAN-based high electron mobility transistors
2014Gallium Nitride (GaN)-based high electron mobility transistors (HEMTs) are emerging as promising contenders to replace existing Silicon and Gallium Arsenide (GaAs) devices in the radio-frequency/microwave power amplifiers .and high-power switching applications.
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Microwave noise in InP/InGaAs composite channel high electron mobility transistors (HEMTs)
2005 Asia-Pacific Microwave Conference Proceedings, 2005In this work, the study of the microwave noise performance for InGaAs/InP composite channel HEMT compared to InGaAs channel is performed. Detailed microwave noise characteristics of InP-based HEMT are presented. An interesting observation is that the minimum noise figure (NF/sub min/) in composite channel devices is insensitive to drain bias, which is ...
null Yuwei Liu +2 more
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Load-Pull Methodology to Characterize GaN High-Electron-Mobility Transistors (HEMTs)
2022Nhu Q. Tran +3 more
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High Electron Mobility Transistors (HEMTs)
2007Prashant Chavarkar, Umesh Mishra
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DC CHARACTERISTIC OF HIGH-ELECTRON-MOBILITY TRANSISTOR (HEMT) ON
2019Ruthvik Sainath Meka, A. EL Fatimy
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2021 18th China International Forum on Solid State Lighting & 2021 7th International Forum on Wide Bandgap Semiconductors (SSLChina: IFWS), 2021
Weining Liu +5 more
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Weining Liu +5 more
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