Results 61 to 70 of about 4,697 (147)

Routes to rupture and folding of graphene on rough 6H-SiC(0001) and their identification

Beilstein Journal of Nanotechnology, 2013
Twisted few layer graphene (FLG) is highly attractive from an application point of view, due to its extraordinary electronic properties. In order to study its properties, we demonstrate and discuss three different routes to in situ create and identify ...
M. Temmen, O. Ochedowski, B. Kleine Bussmann, M. Schleberger, M. Reichling, T. R. J. Bollmann   +5 more
doaj   +1 more source

Ohmic-to-Schottky Modification of Zno-Metal Contact Modulated by Film Thickness [PDF]

Materials Research
This work investigated the charge transport behavior at the interface between a Pt-Ir metal contact and transparent zinc oxide (ZnO) electrodes with one, four, and eight ZnO layers.
Raquele Lima Moreira, Luis Paulo Mourão dos Santos, Francisco Carlos Carneiro Soares Salomão, Eduardo B. Barros, Igor Frota Vasconcelos   +4 more
doaj   +1 more source

Study of the GdK2Nb5O thin film by scanning probe microscopy and X-ray diffraction methods

Journal of Advanced Dielectrics
Ferroelectric thin films of GdK2Nb5O[Formula: see text] (GKN) are considered one of the new promising materials for computer memory systems. The electric potential of the GKN surface in the near vicinity of the burnt-in Pt electrode was measured using ...
M. A. Bunin, S. M. Tarkhanyan, Yu. A Kuprina, Y. Gagou, M. El Marssi, O. A. Bunina, V. Yu. Kochegarova, I. P. Raevski   +7 more
doaj   +1 more source

Intermodulation electrostatic force microscopy for imaging surface photo-voltage

, 2014
We demonstrate an alternative to Kelvin Probe Force Microscopy for imaging surface potential. The open-loop, single-pass technique applies a low-frequency AC voltage to the atomic force microscopy tip while driving the cantilever near its resonance ...
Daniel Forchheimer, David B. Haviland, Jonas Bergqvist, Melcher J., Olle Inganäs, Per-Anders Thorén, Riccardo Borgani   +6 more
core   +1 more source

Spatially Resolved High Voltage Kelvin Probe Force Microscopy: A Novel Avenue for Examining Electrical Phenomena at Nanoscale

Advanced Physics Research
Kelvin probe force microscopy (KPFM) is a well‐established scanning probe technique, used to measure surface potential accurately; it has found extensive use in the study of a range of materials phenomena.
Conor J. McCluskey, Niyorjyoti Sharma, Jesi R. Maguire, Serene Pauly, Andrew Rogers, TJ Lindsay, Kristina M. Holsgrove, Brian J. Rodriguez, Navneet Soin, John Marty Gregg, Raymond G. P. McQuaid, Amit Kumar   +11 more
doaj   +1 more source

Distinguishing magnetic and electrostatic interactions by a Kelvin probe force microscopy–magnetic force microscopy combination

Beilstein Journal of Nanotechnology, 2011
The most outstanding feature of scanning force microscopy (SFM) is its capability to detect various different short and long range interactions.
Miriam Jaafar, Oscar Iglesias-Freire, Luis Serrano-Ramón, Manuel Ricardo Ibarra, Jose Maria de Teresa, Agustina Asenjo   +5 more
doaj   +1 more source

Correlation of resistance switching and polarization rotation in copper doped zinc oxide (ZnO:Cu) thin films studied by Scanning Probe Microscopy

Journal of Materiomics, 2019
This paper presents multiple-modes Scanning Probe Microscopy (SPM) studies on characterize the correlation of resistance switching (RS) and polarization rotation (PR) in copper doped ZnO (ZnO:Cu) thin films.
Juanxiu Xiao, Tun Seng Herng, Yang Guo, Jun Ding, Ning Wang, Kaiyang Zeng   +5 more
doaj   +1 more source

In-situ investigation of graphene oxide under UV irradiation: Evolution of work function

AIP Advances, 2015
Using in-situ Kelvin probe force microscopy (KPFM) to measure surface potential, we investigated the time-dependent work function evolution of solution-processed graphene oxide (GO) under ultraviolet (UV) irradiation.
Jun Li, Xiang Qi, Guolin Hao, Long Ren, Jianxin Zhong   +4 more
doaj   +1 more source

Local V OC Measurements by Kelvin Probe Force Microscopy Applied on P-I-N Radial Junction Si Nanowires

Nanoscale Research Letters, 2019
This work focuses on the extraction of the open circuit voltage (V OC) on photovoltaic nanowires by surface photovoltage (SPV) based on Kelvin probe force microscopy (KPFM) measurements.
Clément Marchat, Letian Dai, José Alvarez, Sylvain Le Gall, Jean-Paul Kleider, Soumyadeep Misra, Pere Roca i Cabarrocas   +6 more
doaj   +1 more source

Kelvin Probe Force Microscopy (KPFM) for nanoelectronic device characterisation

, 2016
This project is to develope a new method of characterization for Silicon-nano-wire (SiNW) FET and SET devices by using KPFM technology to derive the information of local surface potential change on the channel of SiNW devices. The surface potential is related to many important parameters on material's surface, e.g.
openaire   +1 more source