Results 31 to 40 of about 5,628 (300)
Compensating for artifacts in scanning near-field optical microscopy due to electrostatics
APL Photonics, 2021 Nanotechnology and modern materials science demand reliable local probing techniques on the nanoscopic length scale. Most commonly, scanning probe microscopy methods are applied in numerous variants and shades, for probing the different sample properties.
Tobias Nörenberg +4 more
doaj +1 more source
Dipole-field-assisted charge extraction in metal-perovskite-metal back-contact solar cells [PDF]
, 2017 Hybrid organic-inorganic halide perovskites are low-cost solution-processable solar cell materials with photovoltaic properties that rival those of crystalline silicon.
Bach, Udo +13 more
core +3 more sources
Charge State of Steps on Anatase Tio2(101) at 78 K by Afm/Kpfm
Applied Surface Science, 2023 Jiuyan Wei +3 more
openalex +2 more sources
Formation of double ring patterns on Co2MnSi Heusler alloy thin film by anodic oxidation under scanning probe microscope [PDF]
, 2013 Double ring formation on Co2MnSi (CMS) films is observed at electrical breakdown voltage during local anodic oxidation (LAO) using atomic force microscope (AFM).
Budhani, R. C. +3 more
core +2 more sources
Scanning Quantum Dot Microscopy [PDF]
, 2015 Interactions between atomic and molecular objects are to a large extent defined by the nanoscale electrostatic potentials which these objects produce. We introduce a scanning probe technique that enables three-dimensional imaging of local electrostatic ...
Deilmann, Thorsten +7 more
core +2 more sources
The role of the cantilever in Kelvin probe force microscopy measurements
Beilstein Journal of Nanotechnology, 2011 The role of the cantilever in quantitative Kelvin probe force microscopy (KPFM) is rigorously analyzed. We use the boundary element method to calculate the point spread function of the measuring probe: Tip and cantilever.
George Elias +5 more
doaj +1 more source
Understanding the atomic-scale contrast in Kelvin Probe Force Microscopy [PDF]
, 2009 A numerical analysis of the origin of the atomic-scale contrast in Kelvin probe force microscopy (KPFM) is presented. Atomistic simulations of the tip-sample interaction force field have been combined with a non-contact Atomic Force Microscope/KPFM ...
Bocquet, Franck +3 more
core +4 more sources
MOVPE-Grown Quantum Cascade Laser Structures Studied by Kelvin Probe Force Microscopy
Crystals, 2020 A technique for direct study of the distribution of the applied voltage within a quantum cascade laser (QCL) has been developed. The detailed profile of the potential in the laser claddings and laser core region has been obtained by gradient scanning ...
Konstantin Ladutenko +3 more
doaj +1 more source
APL Materials, 2023 The disordered microscopic structure of amorphous semiconductors causes the formation of band tails in the density of states (DOS) that strongly affect charge transport properties.
Luca Fabbri +5 more
doaj +1 more source
Kelvin probe force microscopy in liquid using electrochemical force microscopy
Beilstein Journal of Nanotechnology, 2015 Conventional closed loop-Kelvin probe force microscopy (KPFM) has emerged as a powerful technique for probing electric and transport phenomena at the solid–gas interface.
Liam Collins +6 more
doaj +1 more source