Results 41 to 50 of about 5,616 (276)

MOFs and COFs in Electronics: Bridging the Gap between Intrinsic Properties and Measured Performance

Advanced Functional Materials, EarlyView.
Metal‐organic frameworks (MOFs) and covalent organic frameworks (COFs) hold promise for advanced electronics. However, discrepancies in reported electrical conductivities highlight the importance of measurement methodologies. This review explores intrinsic charge transport mechanisms and extrinsic factors influencing performance, and critically ...
Jonas F. Pöhls, R. Thomas Weitz
wiley   +1 more source

Spatially Resolved High Voltage Kelvin Probe Force Microscopy: A Novel Avenue for Examining Electrical Phenomena at Nanoscale

Advanced Physics Research
Kelvin probe force microscopy (KPFM) is a well‐established scanning probe technique, used to measure surface potential accurately; it has found extensive use in the study of a range of materials phenomena.
Conor J. McCluskey, Niyorjyoti Sharma, Jesi R. Maguire, Serene Pauly, Andrew Rogers, TJ Lindsay, Kristina M. Holsgrove, Brian J. Rodriguez, Navneet Soin, John Marty Gregg, Raymond G. P. McQuaid, Amit Kumar   +11 more
doaj   +1 more source

Research Update: Nanoscale surface potential analysis of MoS2 field-effect transistors for biomolecular detection using Kelvin probe force microscopy

APL Materials, 2016
We used high-resolution Kelvin probe force microscopy (KPFM) to investigate the immobilization of a prostate specific antigen (PSA) antibody by measuring the surface potential (SP) on a MoS2 surface over an extensive concentration range (1 pg/ml–100 μg ...
Min Hyung Kim, Heekyeong Park, Hyungbeen Lee, Kihwan Nam, Seokhwan Jeong, Inturu Omkaram, Dae Sung Yoon, Sei Young Lee, Sunkook Kim, Sang Woo Lee   +9 more
doaj   +1 more source

Physical Study by Surface Characterizations of Sarin Sensor on the Basis of Chemically Functionalized Silicon Nanoribbon Field Effect Transistor

, 2016
Surface characterizations of an organophosphorus (OP) gas detector based on chemically functionalized silicon nanoribbon field-effect transistor (SiNR-FET) were performed by Kelvin Probe Force Microscopy (KPFM) and ToF-SIMS, and correlated with changes ...
Carella, A., Dubois, E., Guerin, D., Lenfant, S., Melin, T., Ordronneau, L., Passi, V., Simonato, J. P., Smaali, K., Vuillaume, D.   +9 more
core   +4 more sources

Efficient NiOx Hole Transport Layers Enabled by Multifunctional MXenes for High‐Performance Tin‐Lead Perovskite Solar Cells

Advanced Functional Materials, EarlyView.
An efficient NiOx HTL is successfully prepared by introducing MXene as an additive without further surface modification to fabricate high‐performance FASn0.5Pb0.5I3 perovskite solar cells. The introduction of MXene contributes to improved conductivity of NiOx, better aligned at NiOx/perovskite interfaces, and enhanced quality of perovskite films ...
Lijun Chen, Guanqi Tang, Yanghou Wang, Xiaolong Cao, Junjun Jin, Jie Tang, Liyang Yu, Zheng Zhou, Peng You, Hanlin Hu, Weiqing Yang, Qidong Tai, Feng Yan   +12 more
wiley   +1 more source

Artifacts in time-resolved Kelvin probe force microscopy

Beilstein Journal of Nanotechnology, 2018
Kelvin probe force microscopy (KPFM) has been used for the characterization of metals, insulators, and semiconducting materials on the nanometer scale. Especially in semiconductors, the charge dynamics are of high interest.
Sascha Sadewasser, Nicoleta Nicoara, Santiago D. Solares   +2 more
doaj   +1 more source

High-Bandwidth Multiparametric Kelvin Probe Force Microscopy With Polymer Microcantilevers

IEEE Access, 2019
Simultaneous and rapid measurement of the surface potential (SP) and nanomechanical properties (NMPs) of materials plays an important role in the study of, for example, piezoelectric materials and multi-component composites.
Hao Zhang, Xianghe Meng, Jianmin Song, Junyuan Geng, Peng Jin, Hui Xie   +5 more
doaj   +1 more source

Nanoscale photovoltage mapping in CZTSe/CuxSe heterostructure by using kelvin probe force microscopy

Materials Research Express, 2020
In the present work, kelvin probe force microscopy (KPFM) technique has been used to study the CZTSe/Cu _x Se bilayer interface prepared by multi-step deposition and selenization process of metal precursors.
Manoj Vishwakarma, Deepak Varandani, Mylene Hendrickx, Joke Hadermann, B R Mehta   +4 more
doaj   +1 more source

Changes in plasma membrane surface potential of PC12 cells as measured by Kelvin probe force microscopy. [PDF]

PLoS ONE, 2012
The plasma membrane of a cell not only works as a physical barrier but also mediates the signal relay between the extracellular milieu and the cell interior.
Chia-Chang Tsai, Hui-Hsing Hung, Chien-Pang Liu, Yit-Tsong Chen, Chien-Yuan Pan   +4 more
doaj   +1 more source

Nondestructive KPFM-assisted Quality Control in Fabrication of GaAs High-Speed Electronics

, 2022
In this paper, we report on the method of nondestructive quality control that can be used in fabrication of GaAs high-speed electronics. The method relies on the surface potential mapping and enables rigid in vivo analysis of transport properties of an active electronic device incorporated into a complex integrated circuit. The study is inspired by our
Shurakov, Alexander, Kaurova, Natalia, Belikov, Ivan, Zilberley, Tatyana, Prikhodko, Anatoliy, Voronov, Boris, Gol'tsman, Gregory   +6 more
openaire   +2 more sources