Results 41 to 50 of about 5,628 (300)
AIP Advances, 2020 We applied Kelvin probe force microscopy (KPFM) to characterize the p-n junction grown on hydride vapor-phase epitaxy GaN wafers with three different doses of the p-type dopant Mg.
Tomonori Nakamura +3 more
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Nanoscale Structure of Lipid–Gemini Surfactant Mixed Monolayers Resolved with AFM and KPFM Microscopy [PDF]
NanomaterialsDrug delivery vehicles composed of lipids and gemini surfactants (GS) are promising in gene therapy. Tuning the composition and properties of the delivery vehicle is important for the efficient load and delivery of DNA fragments (genes). In this paper, we studied novel gene delivery systems composed of 1,2-dioleoyl-sn-glycero-3-phosphocholine (DOPC), 1,
Robert D. E. Henderson +5 more
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An upper bound for the magnetic force gradient in graphite
, 2010 Cervenka et al. have recently reported ferromagnetism along graphite steps. We present Magnetic Force microscopy (MFM) data showing that the signal along the steps is independent of an external magnetic field.
Agustina Asenjo +5 more
core +1 more source
Nanoimaging of Organic Charge Retention Effects: Implications for Nonvolatile Memory, Neuromorphic Computing, and High Dielectric Breakdown Devices [PDF]
, 2019 While a large variety of organic and molecular materials have been found to exhibit charge memory effects, the underlying mechanism is not well-understood, which hinders rational device design. Here, we study the charge retention mechanism of a nanoscale
Caillard, L +7 more
core +2 more sources
Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy
Beilstein Journal of Nanotechnology, 2011 Surfaces of thin oxide films were investigated by means of a dual mode NC-AFM/STM. Apart from imaging the surface termination by NC-AFM with atomic resolution, point defects in magnesium oxide on Ag(001) and line defects in aluminum oxide on NiAl(110 ...
Thomas König +4 more
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Modelling and experimental verification of tip-induced polarization in Kelvin probe force microscopy measurements on dielectric surfaces [PDF]
, 2015 Kelvin probe force microscopy is a widely used technique for measuring surface potential distributions on the micro- and nanometer scale. The data are, however, often analyzed qualitatively, especially for dielectrics.
Nielsen, Dennis Achton +2 more
core +2 more sources
Beilstein Journal of Nanotechnology, 2021 In this study, a dual phase composite (CSO-FC2O) consisting of 60 vol % Ce0.8Sm0.2O1.9 as oxygen-conductive phase and 40 vol % FeCo2O4 as electron-conductive phase was synthesized.
Kerstin Neuhaus +6 more
doaj +1 more source
Conduction of topologically-protected charged ferroelectric domain walls
, 2011 We report on the observation of nanoscale conduction at ferroelectric domain walls in hexagonal HoMnO3 protected by the topology of multiferroic vortices using in situ conductive atomic force microscopy, piezoresponse force microscopy, and kelvin-probe ...
J. R. Guest +6 more
core +1 more source
Applying KPFM on all solid-state battery interfaces research
, 2023 All-solid-state batteries as potential next generation batteries are attracting increasingly more attention. Compared to liquid electrolyte-based lithium-ion batteries, all-solid-state batteries have obvious advantages, including non-flammability and higher energy density.
openaire +2 more sources
Nanomaterials, 2023 Silver nanoclusters are valuable for a variety of applications. A combination of direct current (DC) magnetron sputtering and inert gas condensation methods, employed within an ultra-high vacuum (UHV) system, was used to generate Ag nanoclusters with an ...
Ishaq Musa +2 more
doaj +1 more source