Results 51 to 60 of about 5,628 (300)
KPFM visualisation of the Schottky barrier at the interface between gold nanoparticles and silicon
Gold nanoparticles (AuNPs) deposited on a doped silicon substrate induce a local band bending and a local accumulation of positive charges in a semiconductor.
Lechaptois, Luis +2 more
openaire +3 more sources
This review explores functional and responsive materials for triboelectric nanogenerators (TENGs) in sustainable smart agriculture. It examines how particulate contamination and dirt affect charge transfer and efficiency. Environmental challenges and strategies to enhance durability and responsiveness are outlined, including active functional layers ...
Rafael R. A. Silva +9 more
wiley +1 more source
Kelvin probe force microscopy (KPFM) is a well‐established scanning probe technique, used to measure surface potential accurately; it has found extensive use in the study of a range of materials phenomena.
Conor J. McCluskey +11 more
doaj +1 more source
We used high-resolution Kelvin probe force microscopy (KPFM) to investigate the immobilization of a prostate specific antigen (PSA) antibody by measuring the surface potential (SP) on a MoS2 surface over an extensive concentration range (1 pg/ml–100 μg ...
Min Hyung Kim +9 more
doaj +1 more source
MOFs and COFs in Electronics: Bridging the Gap between Intrinsic Properties and Measured Performance
Metal‐organic frameworks (MOFs) and covalent organic frameworks (COFs) hold promise for advanced electronics. However, discrepancies in reported electrical conductivities highlight the importance of measurement methodologies. This review explores intrinsic charge transport mechanisms and extrinsic factors influencing performance, and critically ...
Jonas F. Pöhls, R. Thomas Weitz
wiley +1 more source
Artifacts in time-resolved Kelvin probe force microscopy
Kelvin probe force microscopy (KPFM) has been used for the characterization of metals, insulators, and semiconducting materials on the nanometer scale. Especially in semiconductors, the charge dynamics are of high interest.
Sascha Sadewasser +2 more
doaj +1 more source
High-Bandwidth Multiparametric Kelvin Probe Force Microscopy With Polymer Microcantilevers
Simultaneous and rapid measurement of the surface potential (SP) and nanomechanical properties (NMPs) of materials plays an important role in the study of, for example, piezoelectric materials and multi-component composites.
Hao Zhang +5 more
doaj +1 more source
Nanoscale photovoltage mapping in CZTSe/CuxSe heterostructure by using kelvin probe force microscopy
In the present work, kelvin probe force microscopy (KPFM) technique has been used to study the CZTSe/Cu _x Se bilayer interface prepared by multi-step deposition and selenization process of metal precursors.
Manoj Vishwakarma +4 more
doaj +1 more source
Changes in plasma membrane surface potential of PC12 cells as measured by Kelvin probe force microscopy. [PDF]
The plasma membrane of a cell not only works as a physical barrier but also mediates the signal relay between the extracellular milieu and the cell interior.
Chia-Chang Tsai +4 more
doaj +1 more source
Scanning Probe Investigation of Anatase TiO2Films Using AFM, PC-AFM, and KPFM
Estely Carranza
openalex +3 more sources

