Results 51 to 60 of about 236 (173)

A novel SOI LDMOS with substrate field plate and variable-k dielectric buried layer

open access: yesResults in Physics, 2018
A novel silicon-on-insulator (SOI) lateral double-diffused metal-oxide-semiconductor (LDMOS) structure has been proposed. The new structure features a substrate field plate (SFP) and a variable-k dielectric buried layer (VKBL).
Qi Li   +6 more
doaj   +1 more source

High figure-of-merit SOI power LDMOS for power integrated circuits

open access: yesEngineering Science and Technology, an International Journal, 2015
The structural modifications in the conventional power laterally diffused metal-oxide-semiconductor field-effect transistor (LDMOS) are carried out to improve the breakdown voltage, on-resistance, gate-charge and figure-of-merits of the device with ...
Yashvir Singh, Rahul Singh Rawat
doaj   +1 more source

Modeling and Simulation of LDMOS Device

open access: yesInternational Journal of Engineering Research, 2015
Laterally Diffused MOSFET (LDMOS) are widely used in modern communication industry and other applications. LDMOS offers various advantages over conventional MOSFETs with little process change. In the present paper, an LDMOS device is modeled and simulated in SILVACO device simulator package using the ATHENA and ATLAS modules.
Sunitha HD, Keshaveni N
openaire   +1 more source

Bringing MRI to low‐ and middle‐income countries: Directions, challenges and potential solutions

open access: yesNMR in Biomedicine, Volume 37, Issue 7, July 2024.
While MRI technology has advanced, several socioeconomic and technological challenges remain as barriers to MRI access globally. In this paper, we have described a holistic framework that tackles numerous different aspects to provide a structure for future research and development.
Sanjana Murali   +10 more
wiley   +1 more source

Channel Length Optimization for Planar LDMOS Field-Effect Transistors for Low-Voltage Power Applications

open access: yesIEEE Journal of the Electron Devices Society, 2020
We identify an optimum channel length for planar Laterally Diffused Metal-Oxide-Semiconductor (LDMOS) field-effect transistors, in terms of the specific on-resistance, through systematic device simulation and optimization.
Ali Saadat   +3 more
doaj   +1 more source

Automatic optimal design of field plate for silicon on insulator lateral double‐diffused metal oxide semiconductor using simulated annealing algorithm

open access: yesIET Power Electronics, Volume 17, Issue 4, Page 487-493, 18 March 2024.
In this paper, an automatic optimal design method for field plate (FP) in silicon on insulator lateral double‐diffused metal oxide semiconductor using simulated annealing algorithm is proposed. For a given device structure, the framework can automatically design the FP geometry parameters within the definite range that maximizes the device breakdown ...
Jing Chen   +7 more
wiley   +1 more source

Analysis of Kirk effect of an innovated high side Side-Isolated N-LDMOS device

open access: yesMATEC Web of Conferences, 2016
An ESOA of LDMOS device is very critical for power device performance. Kirk effect is the one of the major problem which leads to poor ESOA performance. The cause of the problem mainly due to the high beta value of parasitic NPN transistor in the p-body.
Lai Ciou Jhong   +8 more
doaj   +1 more source

Reducing the specific on-resistance for a trench-gate-integrated SOI LDMOS by using the double silicon drift layers

open access: yesResults in Physics, 2020
Double silicon drift layers are used to reduce the specific on-resistance (Ron,sp) for a trench-gate-integrated lateral double-diffused MOSFET (DDL TG LDMOS) based on SOI technology in this paper.
Yuan Wang   +7 more
doaj   +1 more source

Electrical current disrupts the electron transfer in defined consortia

open access: yesMicrobial Biotechnology, Volume 17, Issue 1, January 2024.
Abstract Improving methane production through electrical current application to anaerobic digesters has garnered interest in optimizing such microbial electrochemical technologies, with claims suggesting direct interspecies electron transfer (DIET) at the cathode enhances methane yield.
Mon Oo Yee   +2 more
wiley   +1 more source

Evolution of Black‐Box Models Based on Volterra Series

open access: yesJournal of Applied Mathematics, Volume 2015, Issue 1, 2015., 2015
This paper presents a historical review of the many behavioral models actually used to model radio frequency power amplifiers and a new classification of these behavioral models. It also discusses the evolution of these models, from a single polynomial to multirate Volterra models, presenting equations and estimation methods.
Daniel D. Silveira   +3 more
wiley   +1 more source

Home - About - Disclaimer - Privacy