Results 61 to 70 of about 3,543 (201)

Design and fabrication of silicon-on-silicon-carbide substrates and power devices for space applications [PDF]

open access: yes, 2017
A new generation of power electronic semiconductor devices are being developed for the benefit of space and terrestrial harsh-environment applications.
11th European Space Power Conference   +12 more
core   +2 more sources

Electrical current disrupts the electron transfer in defined consortia

open access: yesMicrobial Biotechnology, Volume 17, Issue 1, January 2024.
Abstract Improving methane production through electrical current application to anaerobic digesters has garnered interest in optimizing such microbial electrochemical technologies, with claims suggesting direct interspecies electron transfer (DIET) at the cathode enhances methane yield.
Mon Oo Yee   +2 more
wiley   +1 more source

Evolution of Black‐Box Models Based on Volterra Series

open access: yesJournal of Applied Mathematics, Volume 2015, Issue 1, 2015., 2015
This paper presents a historical review of the many behavioral models actually used to model radio frequency power amplifiers and a new classification of these behavioral models. It also discusses the evolution of these models, from a single polynomial to multirate Volterra models, presenting equations and estimation methods.
Daniel D. Silveira   +3 more
wiley   +1 more source

High-voltage (100 V) ChipfilmTM single-crystal silicon LDMOS transistor for integrated driver circuits in flexible displays [PDF]

open access: yesAdvances in Radio Science, 2009
System-in-Foil (SiF) is an emerging field of large-area polymer electronics that employs new materials such as conductive polymers and electrophoretic micro-capsules (E-Ink) along with ultra-thin and thus flexible chips.
J. N. Burghartz, H. Richter, A. Asif
doaj  

Reducing the specific on-resistance for a trench-gate-integrated SOI LDMOS by using the double silicon drift layers

open access: yesResults in Physics, 2020
Double silicon drift layers are used to reduce the specific on-resistance (Ron,sp) for a trench-gate-integrated lateral double-diffused MOSFET (DDL TG LDMOS) based on SOI technology in this paper.
Yuan Wang   +7 more
doaj   +1 more source

Generalised Berglund relation in LDMOS transistors

open access: yesElectronics Letters, 2011
Berglund related a certain area associated with the normalised MOS C(V) curve to the energy gap of silicon. Despite the fact that in LDMOS transistors the gate capacitance exhibits complicated behaviour associated with the presence of the drift region, it turns out that the Berglund relation remains valid, as confirmed by both measurements and ...
W. Yao   +3 more
openaire   +1 more source

Unified Analytical Model for SOI LDMOS With Electric Field Modulation

open access: yesIEEE Journal of the Electron Devices Society, 2020
The unified analytical model is proposed for SOI LDMOS (Silicon On Insulator Lateral Double-diffused Metal Oxide Semiconductor) based on the electric field modulation in this paper for the first time.
Baoxing Duan   +3 more
doaj   +1 more source

Optimization of Integrated Transistors for Very High Frequency DC-DC Converters [PDF]

open access: yes, 2012
This paper presents a method to optimize integrated lateral double-diffused MOSFET transistors for use in very high frequency (VHF, 30-300 MHz) dc-dc converters. A transistor model valid at VHF switching frequencies is developed.
Anderson, David I.   +2 more
core   +1 more source

Analysis of linear-doped Si/SiC power LDMOSFETs based on device simulation [PDF]

open access: yes, 2016
This paper presents the design and optimization of a 600 V silicon-on-silicon carbide (Si/SiC) laterally diffused MOSFET with linear doping profile in the drift region for high-temperature applications.
Chan, Chun Wa   +2 more
core   +1 more source

An Initial study on The Reliability of Power Semiconductor Devices [PDF]

open access: yes, 2010
An initial literature study combined with some basic comparative simulations has been performed on different electricfield modulation techniques and the subsequent reliability issues are reported for power semiconductor devices.
Boksteen, B.K.   +3 more
core   +1 more source

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