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CMOS-based Spin-Transfer Torque Magnetic Random Access Memory (ST–MRAM)
2010Recently it has been demonstrated that the vortex core magnetization can be switched by applying a short (
B. C. Choi +3 more
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Process optimization and cryogenic evaluation of spin-orbit torque magnetic random access memory
International Memory WorkshopMagnetoresistive random access memory (MRAM) is proposed to be employed in cryogenic memory for low power consumption due to its excellent outstanding performance at low temperature.
Zhongkui Zhang +12 more
semanticscholar +1 more source
Proceedings of the 45th annual Design Automation Conference, 2008
Spin-torque transfer magnetic RAM (STT MRAM) is a promising candidate for future universal memory. It combines the desirable attributes of current memory technologies such as SRAM, DRAM and flash memories. It also solves the key drawbacks of conventional MRAM technology: poor scalability and high write current.
Jing Li +3 more
openaire +1 more source
Spin-torque transfer magnetic RAM (STT MRAM) is a promising candidate for future universal memory. It combines the desirable attributes of current memory technologies such as SRAM, DRAM and flash memories. It also solves the key drawbacks of conventional MRAM technology: poor scalability and high write current.
Jing Li +3 more
openaire +1 more source
Dry etching strategy of spin-transfer-torque magnetic random access memory: A review
, 2020The spin-based memory, spin transfer torque-magnetic random access memory (STT-MRAM), has the potential to enhance the power efficiency of high density memory systems.
R. Islam, B. Cui, G. Miao
semanticscholar +1 more source
Spintronic Processing Unit in Spin Transfer Torque Magnetic Random Access Memory
IEEE Transactions on Electron Devices, 2019Recently, exploiting emerging nonvolatile memories to implement the process-in-memory (PIM) paradigm have shown great potential to address the von Neumann bottleneck and have attracted extensive research and development. In this paper, we present a novel
He Zhang +5 more
semanticscholar +1 more source
IEEE Transactions on Circuits and Systems Part 1: Regular Papers, 2019
With downscaling of process technology, conventional memories encounter challenges, such as soaring static power, low reliability, and charge sharing effect induced by radiation effects.
Bi Wang +7 more
semanticscholar +1 more source
With downscaling of process technology, conventional memories encounter challenges, such as soaring static power, low reliability, and charge sharing effect induced by radiation effects.
Bi Wang +7 more
semanticscholar +1 more source
2010 IEEE Radiation Effects Data Workshop, 2010
J. Heidecker, G. Allen, D. Sheldon
semanticscholar +1 more source
J. Heidecker, G. Allen, D. Sheldon
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