Results 71 to 80 of about 213,422 (311)

Analysis of charge-trapping effects in ultra-low current metal–oxide–semiconductor–oxide–semiconductor devices

open access: yesAIP Advances
In this paper, we present the study of charge-trapping effects in ultra-low current metal–oxide–semiconductor–oxide–semiconductor structures. We fabricated the Al/SiOx/a-Si/SiOx/n++ Si devices using low-temperature processes with various oxide ...
Piotr Wiśniewski   +2 more
doaj   +1 more source

Remaining useful life prognostic of power metal oxide semiconductor field effect transistor based on improved particle filter algorithm

open access: yesAdvances in Mechanical Engineering, 2017
The power metal oxide semiconductor field effect transistor is used extensively in analog circuits and digital circuits. However, it is also the highest failure rate component in the power electronics system.
Lifeng Wu   +3 more
doaj   +1 more source

Laser activated MTOS microwave device [PDF]

open access: yes, 1985
A light-activated semiconductor device usable as an optoelectronic switch, pulse generator or optical detector is provided. A semiconductor device is disclosed which provides back-to-back metal-thin oxide-silicon (MTOS) capacitors.
Maserjian, J.
core   +1 more source

Photonic Engineering Enables All‐Passive Upconversion Imaging with Low‐Intensity Near‐Infrared Light

open access: yesAdvanced Functional Materials, EarlyView.
A passive upconversion imaging system enables the observation of scenes illuminated by low‐intensity incoherent near‐infrared light from 750 to 930 nm, by converting it into the visible without the use of external power. The upconverter is enabled by triplet–triplet annihilation in a bulk heterojunction, with absorption enhanced by plasmonic resonators
Rabeeya Hamid   +13 more
wiley   +1 more source

The MSFC complementary metal oxide semiconductor (including multilevel interconnect metallization) process handbook [PDF]

open access: yes
The fabrication techniques for creation of complementary metal oxide semiconductor integrated circuits at George C. Marshall Space Flight Center are described.
Bouldin, D. L.   +4 more
core   +1 more source

Complementary-MOS binary counter with parallel-set inputs [PDF]

open access: yes, 1970
Metal oxide semiconductor four-stage binary counter contains reset capability as well as four parallel-set inputs gated in by a logic signal.
Keller, K. R., Yung, A. K.
core   +1 more source

Ultrahigh‐Yield, Multifunctional, and High‐Performance Organic Memory for Seamless In‐Sensor Computing Operation

open access: yesAdvanced Functional Materials, EarlyView.
Molecular engineering of a nonconjugated radical polymer enables a significant enhancement of the glass transition temperature. The amorphous nature and tunability of the polymer, arising from its nonconjugated backbone, facilitates the fabrication of organic memristive devices with an exceptionally high yield (>95%), as well as substantial ...
Daeun Kim   +14 more
wiley   +1 more source

Comparative Study of SiO2, Al2O3, and BeO Ultrathin Interfacial Barrier Layers in Si Metal-Oxide-Semiconductor Devices

open access: yesActive and Passive Electronic Components, 2012
In a previous study, we have demonstrated that beryllium oxide (BeO) film grown by atomic layer deposition (ALD) on Si and III-V MOS devices has excellent electrical and physical characteristics.
J. H. Yum   +5 more
doaj   +1 more source

Radiation tolerant silicon nitride insulated gate field effect transistors [PDF]

open access: yes, 1969
Metal-Insulated-Semiconductor Field Effect Transistor /MISFET/ device uses a silicon nitride passivation layer over a thin silicon oxide layer to enhance the radiation tolerance.
Newman, P. A.
core   +1 more source

In Situ Study of Resistive Switching in a Nitride‐Based Memristive Device

open access: yesAdvanced Functional Materials, EarlyView.
In situ TEM biasing experiment demonstrates the volatile I‐V characteristic of MIM lamella device. In situ STEM‐EELS Ti L2/L3 ratio maps provide direct evidence of the oxygen vacancies migrations under positive/negative electrical bias, which is critical for revealing the RS mechanism for the MIM lamella device.
Di Zhang   +19 more
wiley   +1 more source

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