Results 61 to 70 of about 15,720 (226)
A Unified Flash Memory Platform for Mode‐Adaptive and Robust AI Computation
A unified AND‐type flash memory platform enables both transistor‐mode and capacitor‐mode computing‐in‐memory operations within the same device structure. By selectively switching the sensing mode through peripheral reconfiguration, the platform provides adaptable trade‐offs between computational accuracy, robustness, and energy efficiency for AI ...
Dayeon Yu +6 more
wiley +1 more source
MOCVD Growth of Next-Generation III–V Semiconductor Devices: In Review
Metal–organic chemical vapor deposition (MOCVD) is a crystal growth technique used to achieve high-purity thin films, especially III–V materials, for fabricating semiconductor devices.
Zoya Noor +5 more
doaj +1 more source
Impact of Rapid Thermal Annealing on the Structural and Piezoelectric Properties of AlN Thin Films
Aluminum nitride (AlN) is a biocompatible piezoelectric material suitable for energy harvesting in MEMS resonators. Through rapid thermal annealing, a threshold for CMOS‐compatible processes is established. AlN improved its crystallinity and enhanced the piezoelectric coefficient by ∼160%. Devices show an improvement in the electromechanical properties
Laura Mazón‐Maldonado +7 more
wiley +1 more source
Kinetic study of MOCVD III-V quaternary antimonides
The kinetics of MOCVD GaInAsSb and AlGaAsSb was studied by the growth rate as a function of growth temperature and partial pressure of III and V MO species.
Wei GY +4 more
core
Development and Research of the MOCVD Cleaning Robot
With the wide application of the gallium nitride (GaN) preparation method based on Metal–Organic Chemical Vapor Deposition (MOCVD), the automation of MOCVD equipment has become a research hotspot.
Yibo Ren, Zengwen Dong
doaj +1 more source
This paper presents a compressive study on the fabrication and optimization of GaAs metal–oxide–semiconductor (MOS) structures comprising a Al2O3 gate oxide, deposited via atomic layer deposition (ALD), with an AlN interfacial passivation layer prepared ...
Takeshi Aoki +5 more
doaj +1 more source
Photoresist (PR) residue significantly degrades the electrical performance of 2D semiconductors such as MoS2. In particular, the intrinsically ultrathin nature of these materials makes them highly susceptible to damage during conventional PR cleaning procedures.
Dahyeon Kim +9 more
wiley +1 more source
MOCVD-grown InAs/InP quantum dot lasers with low threshold current_Dataset
“MOCVD-grown InAs/InP quantum dot lasers with low threshold current” dataThe dataset includes Excel files with the raw data for each figure in the manuscript.Figure 2(f) Room-temperature PL spectra of capped QDs.Figure 4(a) Light–current (L–I ...
Haotian Zeng (7099877) +11 more
core +1 more source
Since AlGaN offers new opportunities for the development of the solid state ultraviolet (UV) luminescence, detectors and high-power electronic devices, the growth of AlN buffer substrate is concerned.
Jiadai An +4 more
doaj +1 more source
This work presents the development of n‐type Zn1−xGexOx+1 using radiofrequency magnetron sputtering to suppress interface recombination at the heterojunction of Cu(In,Ga)S2 (CIGS) solar cells. The solar cell device with the Zn1−xGexOx+1 buffer layer directly deposited on CIGS absorbers demonstrates a conversion efficiency comparable to that of a device
Yota Suzuki +3 more
wiley +1 more source

