Results 171 to 180 of about 157,312 (300)

A New Simulation Method to Assess Temperature and Radiation Effects on SiC Resonant-Converter Reliability. [PDF]

open access: yesMaterials (Basel)
Feng Z   +7 more
europepmc   +1 more source

A SiC Power MOSFET Loss Model Suitable for High-Frequency Applications

open access: yesIEEE transactions on industrial electronics (1982. Print), 2017
Xuan Li   +6 more
semanticscholar   +1 more source

A Short-Circuit Safe Operation Area Identification Criterion for SiC MOSFET Power Modules

open access: yesIEEE transactions on industry applications, 2017
P. D. Reigosa   +3 more
semanticscholar   +1 more source

Home - About - Disclaimer - Privacy