Results 101 to 110 of about 10,811 (199)

A machine learning framework for predictive electron density modelling to enhance 3D NAND flash memory performance

open access: yese-Prime: Advances in Electrical Engineering, Electronics and Energy
Data storage in electronic devices has been revolutionised by 3D NAND flash memory. However, polycrystalline silicon and grain boundaries offer issues that greatly affect memory performance in terms of string current and Program-Erase Threshold Voltage ...
Dikendra Verma   +2 more
doaj   +1 more source

Intelligent Read Framework With Meta-Learning for NAND Flash Memory Under Process Variation

open access: yesIEEE Access
The storage density of NAND flash memory has significantly increased due to multi-leveling and downscaling technologies. As a side effect of enhanced storage capacity, flash memory becomes vulnerable to circuit-level noise.
Minyoung Hwang   +3 more
doaj   +1 more source

Prediction of Random Telegraph Noise-Induced Threshold Voltage Shift and Its Scaling Dependency Using Machine Learning

open access: yesIEEE Journal of the Electron Devices Society
Random telegraph noise (RTN) shifts the threshold voltage (Vt) of 3D NAND flash memory cells, making it a key factor of the device malfunction. The aim of this study is to predict the distribution of RTN induced ${\mathrm { V}}_{\mathrm { t}}$ shift in
Eunseok Oh, Hyungcheol Shin
doaj   +1 more source

Memorie Flash a NAND

open access: yes
In questa tesi verranno trattate le memorie Flash. Partendo da una breve introduzione all'argomento, si studierà prima il funzionamento a livello fisico del transistor, il suo inserimento in un'architettura a NAND e i metodi di accesso e scrittura del dati in tale contesto.
openaire   +1 more source

Dynamic pass bias control for temperature-resilient neural networks using vertical NAND flash memory. [PDF]

open access: yesNano Converg
Park SH   +11 more
europepmc   +1 more source

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