Results 101 to 110 of about 29,727 (252)

Recent Progress and Opportunities in Oxide Semiconductor Devices for In‐Memory and Neuromorphic Computing

open access: yesAdvanced Electronic Materials, Volume 12, Issue 7, 6 April 2026.
This review surveys oxide‐semiconductor devices for in‐memory and neuromorphic computing, highlighting recent progress and remaining challenges in charge‐trap, ferroelectric, and two‐transistor devices. Oxide semiconductors, featuring ultra‐low leakage, low‐temperature processing, and back‐end‐of‐line compatibility, are explored for analog in‐memory ...
Suwon Seong   +4 more
wiley   +1 more source

Characterizing 3D Floating Gate NAND Flash

open access: yes, 2018
As both NAND flash memory manufacturers and users are turning their attentions from planar architecture towards three-dimensional (3D) architecture, it becomes critical and urgent to understand the characteristics of 3D NAND flash memory.
Yue Zhu   +7 more
core   +1 more source

Self-Organizing Mapping Neural Network Implementation Based on 3-D NAND Flash for Competitive Learning

open access: yesIEEE Journal of the Electron Devices Society
Self-organizing Map (SOM) neural network is a prominent algorithm in unsupervised machine learning, which is widely used for data clustering, high-dimensional visualization, and feature extraction.
Anyi Zhu   +4 more
doaj   +1 more source

ELECTRICAL CHARACTERIZATION, PHYSICS, MODELING AND RELIABILITY OF INNOVATIVE NON-VOLATILE MEMORIES

open access: yes, 2012
Enclosed in this thesis work it can be found the results of a three years long research activity performed during the XXIV-th cycle of the Ph.D. school in Engineering Science of the Università degli Studi di Ferrara. The topic of this work is concerned
Zambelli, Cristian
core  

NAND flash memory technologies

open access: yes, 2016
This book discusses basic and advanced NAND flash memory technologies, including the principle of NAND flash, memory cell technologies, multi-bits cell technologies, scaling challenges of memory cell, reliability, and 3-dimensional cell as the future ...
Aritome, Seiichi
core  

Analysis of HBM Failure in 3D NAND Flash Memory

open access: yes, 2022
Electrostatic discharge (ESD) events are the main factors impacting the reliability of NAND Flash memory. The behavior of human body model (HBM) failure and the corresponding physical mechanism of 3D NAND Flash memory are investigated in this paper.
Xin Wang   +6 more
core   +1 more source

A NOR Emulation Strategy over NAND Flash Memory

open access: yes, 2007
快閃記憶體大致可分為兩類:NOR型快閃記憶體及NAND型快閃記憶體。一般而言,因為有就地執行(eXecute-In-Place,XIP)和快速讀取等特性,NOR型快閃記憶體應用上適用於儲存程式的可執行檔。而擁有較大容量與較快寫入速度的NAND型快閃記憶體則適用於資料儲存。此外,兩者在成本上有很大的差距,NOR型快閃記憶體相對於NAND型快閃記憶體高出許多。基於市場的趨勢,若能以較具經濟效益的NAND型快閃記憶體取代NOR型快閃,將可大幅地降低成本、提升毛利。在這篇論文中 ...
Lin, Chien-Hung, 林建宏
core  

Leveraging the page buffer data cache for enhanced programmability in NAND flash memories with on‐chip microcontrollers

open access: yesElectronics Letters
This paper proposes a simple yet effective scheme for NAND Flash memories that employ on‐chip microcontroller units (MCUs) to manage internal array operations.
Geonu Kim
doaj   +1 more source

Vertical 3D NAND Flash Memory Technology

open access: yes, 2011
We've developed Bit Cost Scalable (BiCS) flash technology as a three-dimensional memory for the future ultra high density storage devices, which extremely reduces the chip costs by vertically stacking memory arrays with punch and plug process.
Hideaki Aochi, Akihiro Nitayama
core   +1 more source

NAND flash memory

open access: yes, 2016
V diplomskem delu so predstavljene arhitekturne lastnosti NAND bliskovnih pomnilnikov skupaj z lastnostmi čipov, ki jih vsebujejo. Obravnavane so različne programske metode upravljanja z NAND bliskovnim pomnilnikom, predstavljena pa je ena izmed možnih ...
UMEK, VLADIMIR
core  

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