Results 81 to 88 of about 234 (88)
Some of the next articles are maybe not open access.

Down-Coupling Phenomenon of Floating Channel in 3D NAND Flash Memory

IEEE Electron Device Letters, 2016
Yoon Kim, Myounggon Kang
exaly  

TID Sensitivity of NAND Flash Memory Building Blocks

IEEE Transactions on Nuclear Science, 2009
Simone Gerardin   +2 more
exaly  

TID Test of an 8-Gbit NAND Flash Memory

IEEE Transactions on Nuclear Science, 2009
exaly  

Retention Improvement in Vertical NAND Flash Memory Using Electron Back-Tunneling

IEEE Electron Device Letters
Jongwon Back, Ho-Nam Yoo, Jong-Ho Lee
exaly  

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