Results 111 to 120 of about 1,986,606 (160)

Effects of Edge Thinning on Fowler-Nordheim Tunneling Current of NAND-Type Flash Memory Cells

open access: yes, 2011
The edge thinning of tunnel oxide is numerically found to increase the Fowler-Nordheim (FN) tunneling gate current in NAND-type Flash cells during programming and erasing operations.
Ji-Ting Liang   +8 more
core  

Model-Inversion-Resistant Physical Unclonable Neural Network Using Vertical NAND Flash Memory. [PDF]

open access: yesAdv Sci (Weinh)
Park SH   +8 more
europepmc   +1 more source

Dynamic pass bias control for temperature-resilient neural networks using vertical NAND flash memory. [PDF]

open access: yesNano Converg
Park SH   +11 more
europepmc   +1 more source

a memory-efficient flash translation layer supporting multiple mapping granularities

open access: yes, 2009
학위논문(석사) - 한국과학기술원 : 전산학전공, 2009.2, [ vi, 47 p. ]NAND flash memory is being widely adopted as a storage medium for embedded devices. FTL (Flash Translation Layer) is one of the most essential software components in NAND flash-based embedded devices as
이용구, Lee, Yong-Goo
core  

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