Results 191 to 199 of about 10,811 (199)
Some of the next articles are maybe not open access.

Improving the reliability of chip-off forensic analysis of NAND flash memory devices

Digital Investigation, 2017
Aya Fukami, Saugata Ghose, Yixin Luo
exaly  

256 Gb 3 b/Cell V-nand Flash Memory With 48 Stacked WL Layers

IEEE Journal of Solid-State Circuits, 2017
Dongku Kang, Chulbum Kim, Cheon An Lee
exaly  

Emerging constraints on NAND Flash memory reliability

2012
MONZIO COMPAGNONI, CHRISTIAN   +4 more
openaire   +1 more source

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