Results 21 to 30 of about 8,396,680 (189)

Self-checking monitor for NBTI due degradation [PDF]

, 2010
Performance degradation of integrated circuits due to aging effects, such as Negative Bias Temperature Instability (NBTI), is becoming of great concern for current and future CMOS technology.
C. Metra, Metra, Cecilia, Omana, Martin, N. Bosio, Rossi D., Bosio N., Bosio, Nicolo', Omana M., Metra C., M. Omana, D. Rossi, OMANA, MARTIN EUGENIO, Rossi, Daniele   +12 more
core   +1 more source

Negative bias temperature instability (NBTI) experiment [PDF]

, 2006
The phenomenon known as Negative Bias Temperature Instability (NBTI) impacts the operational characteristics of Complementary Metal Oxide Semiconductor (CMOS) devices, and tends to have a stronger effect on p-channel devices. This instability is observed
Schuster, Christopher Mark.
core   +2 more sources

Data-Driven Modeling of Low Frequency Noise Using Capture-Emission Energy Maps

Applied Sciences, 2020
A new approach for modeling low frequency noise is presented to enable the predictions of noise behavior from negative bias temperature instability (NBTI). The noise model is based on a capture-emission energy (CEE) map describing the probability density
Jonghwan Lee
doaj   +1 more source

Impact of NBTI Stress on VDMOSFET Regions

Algerian Journal of Signals and Systems, 2018
In this paper, we investigate the impact of negative bias temperature instability (NBTI) degradation on both channel and drain regions, of commercial power double diffused MOS transistor (VDMOSFET), using capacitance-voltage method (C-V). We report that
Sidi Mohammed Merah, Bouchra Nadji
doaj   +1 more source

NBTI and Power Reduction Using an Input Vector Control and Supply Voltage Assignment Method

Algorithms, 2017
As technology scales, negative bias temperature instability (NBTI) becomes one of the primary failure mechanisms for Very Large Scale Integration (VLSI) circuits.
Peng Sun, Zhiming Yang, Yang Yu, Junbao Li, Xiyuan Peng   +4 more
doaj   +1 more source

Similarities Between Ionizing Radiation Effects and Negative-Bias Temperature Instability (NBTI) in Mosfet Devices [PDF]

ECS Meeting Abstracts, 2013
Abstract not Available.
Harold P. Hjalmarson, Duc Nguyen, Kenneth Kambour, Camron Kouhestani, Roderick A.B. Devine   +4 more
openaire   +2 more sources

Anti-Interference Low-Power Double-Edge Triggered Flip-Flop Based on C-Elements

Tsinghua Science and Technology, 2022
When the input signal has been interfered and glitches occur, the power consumption of Double-Edge Triggered Flip-Flops (DETFFs) will significantly increase.
Zhengfeng Huang, Xiao Yang, Tai Song, Haochen Qi, Yiming Ouyang, Tianming Ni, Qi Xu   +6 more
doaj   +1 more source

Ingress of Threshold Voltage-Triggered Hardware Trojan in the Modern FPGA Fabric–Detection Methodology and Mitigation

IEEE Access, 2020
The ageing phenomenon of negative bias temperature instability (NBTI) continues to challenge the dynamic thermal management of modern FPGAs. Increased transistor density leads to thermal accumulation and propagates higher and non-uniform temperature ...
Sohaib Aslam, Ian K. Jennions, Mohammad Samie, Suresh Perinpanayagam, Yisen Fang   +4 more
doaj   +1 more source

An Ageing-Aware and Temperature Mapping Algorithm for Multilevel Cache Nodes

IEEE Access, 2023
Increase in chip inactivity in the future threatens the performance of many-core systems and therefore, efficient techniques are required for continuous scaling of transistors.
Emmanuel Ofori-Attah, Michael Opoku Agyeman   +1 more
doaj   +1 more source

Temperature stabilization for negative bias temperature instability [PDF]

, 2007
Previous research was conducted on a Complementary Metal Oxide Semiconductor (CMOS) to determine the impact of a phenomenon known as Negative Bias Temperature Instability (NBTI).
Harbison, Brian K.
core   +2 more sources